Refractive index and thickness determination of thin-films using Lloyd's interferometer

Optics Communications

Volumn 225, Issue 4-6, 2003, Pages 341-348

  Hamza, A A ^a   Mabrouk, M A ^a   Ramadan, W A ^a   Emara, A M ^a  

^a Mansoura University   (Egypt)

Author keywords

Interference; Refractive index; Thickness; Thin films

Indexed keywords

INTERFEROMETERS; LIGHT INTERFERENCE; LIGHT REFLECTION; REFRACTIVE INDEX; THICKNESS MEASUREMENT;

PARTIAL DERIVATIVES;

THIN FILMS;

EID: 0141509950     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2003.08.003     Document Type: Article

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