Birefringence determination in ion-exchanged waveguides

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2954, Issue , 1996, Pages 111-116

  Bertolotti, Mario ^a   Ramadan, W A ^a,b   Monteleone, F ^a   Fazio, Eugenio ^a   Pelli, Stefano ^c   Righini, Giancarlo C ^c  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

^b MANSOURA UNIVERSITY   (Egypt)

^c IFAC CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; INTEGRATED CIRCUITS; INTEGRATED OPTICS; IONS; OPTICAL MATERIALS; OPTICAL PROPERTIES; PHOTONICS; STRESS CONCENTRATION; STRESSES; WAVEGUIDES;

DIFFUSION PROCESSES; EXPERIMENTAL DATUMS; FABRICATION PROCESSES; MECHANICAL STRESSES; STRESS DISTRIBUTIONS;

ION EXCHANGE;

EID: 0141694158     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.262434     Document Type: Conference Paper

References (10)

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