-
3
-
-
0000156089
-
-
Finklea, H.O.; Robinson, L. R.; Blackburn, A.; Richter, B.; Allara, D.; Bright, T. Langmuir 1986, 2, 239.
-
(1986)
Langmuir
, vol.2
, pp. 239
-
-
Finklea, H.O.1
Robinson, L.R.2
Blackburn, A.3
Richter, B.4
Allara, D.5
Bright, T.6
-
5
-
-
0001165321
-
-
Lee, H.; Kepley, L. J.; Hong, H.-G.; Mallouk, T. E. J. Am. Chem. Soc. 1988, 110, 618.
-
(1988)
J. Am. Chem. Soc.
, vol.110
, pp. 618
-
-
Lee, H.1
Kepley, L.J.2
Hong, H.-G.3
Mallouk, T.E.4
-
6
-
-
0024278638
-
-
Lee, H.; Kepley, L. J.; Hong, H.-G.; Akhter, S.; Mallouk, T. E. J. Phys. Chem. 1988, 92, 2597.
-
(1988)
J. Phys. Chem.
, vol.92
, pp. 2597
-
-
Lee, H.1
Kepley, L.J.2
Hong, H.-G.3
Akhter, S.4
Mallouk, T.E.5
-
8
-
-
0000536266
-
-
Katz, H. E.; Bent, S. F.; Wilson, W. L.; Schilling, M. L.; Ungashe, S. B. J. Am. Chem. Soc. 1994, 116, 6631.
-
(1994)
J. Am. Chem. Soc.
, vol.116
, pp. 6631
-
-
Katz, H.E.1
Bent, S.F.2
Wilson, W.L.3
Schilling, M.L.4
Ungashe, S.B.5
-
9
-
-
0001717183
-
-
Cao, G.; Garcia, M. E.; Alcala, M.; Burgess, L. F.; Mallouk, T. E. J. Am. Chem. Soc. 1992, 114, 7574.
-
(1992)
J. Am. Chem. Soc.
, vol.114
, pp. 7574
-
-
Cao, G.1
Garcia, M.E.2
Alcala, M.3
Burgess, L.F.4
Mallouk, T.E.5
-
10
-
-
0001473139
-
-
Rong, D.; Hong, H.-G.; Kim, Y. I.; Kruger, J. E.; Mayer, J. E.; Mallouk, T. E. Coord. Chem. Rev. 1990, 97, 237.
-
(1990)
Coord. Chem. Rev.
, vol.97
, pp. 237
-
-
Rong, D.1
Hong, H.-G.2
Kim, Y.I.3
Kruger, J.E.4
Mayer, J.E.5
Mallouk, T.E.6
-
11
-
-
0040283497
-
-
Vermuelen, L. A.; Snover, J. L.; Sapochak, L. S.; Thompson, M. E. J. Am. Chem. Soc. 1993, 115, 11767.
-
(1993)
J. Am. Chem. Soc.
, vol.115
, pp. 11767
-
-
Vermuelen, L.A.1
Snover, J.L.2
Sapochak, L.S.3
Thompson, M.E.4
-
12
-
-
0026112923
-
-
(a) Yee, J. K.; Parry, D. B.; Caldwell, K. D.; Harris, J. M. Langmuir 1991, 7, 307-313.
-
(1991)
Langmuir
, vol.7
, pp. 307-313
-
-
Yee, J.K.1
Parry, D.B.2
Caldwell, K.D.3
Harris, J.M.4
-
13
-
-
0035797975
-
-
(b) Ledung, G.; Bergkvist, M.; Quist, A. P.; Gelius, U.; Carlsson, J.; Oscarsson, S. Langmuir 2001, 17, 6056.
-
(2001)
Langmuir
, vol.17
, pp. 6056
-
-
Ledung, G.1
Bergkvist, M.2
Quist, A.P.3
Gelius, U.4
Carlsson, J.5
Oscarsson, S.6
-
14
-
-
0003081693
-
-
Ichinose, N.; Sugimura, J.; Uchida, T.; Shimo, N. Chem. Lett. 1993, 11, 1961.
-
(1993)
Chem. Lett.
, vol.11
, pp. 1961
-
-
Ichinose, N.1
Sugimura, J.2
Uchida, T.3
Shimo, N.4
-
16
-
-
0012655725
-
-
Geyer, W.; Stadler, V.; Eck, W.; Gölzhäuser, A.; Sauer, M.; Weimann, Th.; Hinze, P. J. Vac. Sci. Technol. B 2001, 19, 6.
-
(2001)
J. Vac. Sci. Technol. B
, vol.19
, pp. 6
-
-
Geyer, W.1
Stadler, V.2
Eck, W.3
Gölzhäuser, A.4
Sauer, M.5
Weimann, Th.6
Hinze, P.7
-
19
-
-
0024278638
-
-
Lee, H.; Kepley, L. J.; Hong, H.-G.; Akhter, S.; Mallouk, T. E. J. Phys. Chem. 1988, 92, 2597.
-
(1988)
J. Phys. Chem.
, vol.92
, pp. 2597
-
-
Lee, H.1
Kepley, L.J.2
Hong, H.-G.3
Akhter, S.4
Mallouk, T.E.5
-
21
-
-
0004136061
-
-
note; John Wiley and Sons: New York
-
-d/λ, where d is the film thickness and λ is the escape depth for electrons from the interface through the film material: Ghosh, P. K. Introduction to Photoelectron Spectroscopy; John Wiley and Sons: New York, 1983.
-
(1983)
Introduction to Photoelectron Spectroscopy
-
-
Ghosh, P.K.1
-
22
-
-
0028387002
-
-
note
-
(b) The escape depth for 1100 eV electrons through polyethylene is about 30 Å: Tanuma, S.; Powell, C. J.; Penn, D. R. Surf. Interface Anal. 1993, 21, 165-176. For an 18 Å overlayer, about 55% of the electrons originating at the primer layer would penetrate.
-
(1993)
Surf. Interface Anal.
, vol.21
, pp. 165-176
-
-
Tanuma, S.1
Powell, C.J.2
Penn, D.R.3
-
23
-
-
0004136061
-
-
note; John Wiley and Sons: New York
-
-d/λ, where d is the film thickness and λ is the escape depth for electrons from the interface through the film material: Ghosh, P. K. Introduction to Photoelectron Spectroscopy; John Wiley and Sons: New York, 1983.
-
(1983)
Introduction to Photoelectron Spectroscopy
-
-
Ghosh, P.K.1
-
24
-
-
0028387002
-
-
note
-
(b) The escape depth for 1100 eV electrons through polyethylene is about 30 Å: Tanuma, S.; Powell, C. J.; Penn, D. R. Surf. Interface Anal. 1993, 21, 165-176. For electrons originating from the primer layer, about 40% of the electrons would penetrate the 27 Å overlayer.
-
(1993)
Surf. Interface Anal.
, vol.21
, pp. 165-176
-
-
Tanuma, S.1
Powell, C.J.2
Penn, D.R.3
-
25
-
-
0141617801
-
-
note
-
Let x = fractional coverage of the diphosphonate monolayer. Zr/P = 0.39/(1.39x + 0.39). Substituting 0.30 for the Zr/P ratio gives x = 0.65.
-
-
-
-
26
-
-
4243607007
-
-
Zhang, Y. F.; Liao, L. S.; Chan, W. H.; Lee, S. T.; Sammynaiken, R.; Sharn, T. K. Phys. Rev. B 2000, 61, 8299.
-
(2000)
Phys. Rev. B
, vol.61
, pp. 8299
-
-
Zhang, Y.F.1
Liao, L.S.2
Chan, W.H.3
Lee, S.T.4
Sammynaiken, R.5
Sharn, T.K.6
-
27
-
-
0001293239
-
-
Castner, D. G.; Hinds, K.; Grainger, D. W. Langmuir 1996, 12, 5083.
-
(1996)
Langmuir
, vol.12
, pp. 5083
-
-
Castner, D.G.1
Hinds, K.2
Grainger, D.W.3
-
28
-
-
0000690883
-
-
Jiao, D.; Barfield, M.; Combariza, J. E.; Hruby, V. J. J. Am. Chem. Soc. 1992, 114, 3639.
-
(1992)
J. Am. Chem. Soc.
, vol.114
, pp. 3639
-
-
Jiao, D.1
Barfield, M.2
Combariza, J.E.3
Hruby, V.J.4
-
29
-
-
0028271465
-
-
Byrd, H.; Whipps, S.; Pike, J. K.; Ma, J.; Nagler, S. E.; Talham, D. R. J. Am. Chem. Soc. 1994, 116, 295.
-
(1994)
J. Am. Chem. Soc.
, vol.116
, pp. 295
-
-
Byrd, H.1
Whipps, S.2
Pike, J.K.3
Ma, J.4
Nagler, S.E.5
Talham, D.R.6
-
30
-
-
0035901780
-
-
Smith, E. A.; Wanat, M. J.; Cheng, Y.; Barreira, S. V. P.; Frutos, A. G.; Corn, R. M. Langmuir 2001, 17, 2502.
-
(2001)
Langmuir
, vol.17
, pp. 2502
-
-
Smith, E.A.1
Wanat, M.J.2
Cheng, Y.3
Barreira, S.V.P.4
Frutos, A.G.5
Corn, R.M.6
-
31
-
-
0035247590
-
-
Lee, W. B.; Oh, Y.; Kim, E. R.; Lee, H. Synth. Met. 2001, 117, 305.
-
(2001)
Synth. Met.
, vol.117
, pp. 305
-
-
Lee, W.B.1
Oh, Y.2
Kim, E.R.3
Lee, H.4
-
32
-
-
0033733948
-
-
Maoz, R.; Frydman, E.; Cohen, S. R.; Sagiv, J. Adv. Mater. 2000, 12, 725.
-
(2000)
Adv. Mater.
, vol.12
, pp. 725
-
-
Maoz, R.1
Frydman, E.2
Cohen, S.R.3
Sagiv, J.4
-
33
-
-
0141506415
-
-
Mizrakh, L. I.; Babushkina, T. A.; Yakovlev, V. G.; Kozlova, L. N.; Yukhno, E. M.; Starostina, L. N.; Yanochkina, G. A J. Gen. Chem. USSR (Engl. Transl.) 1973, 43, 2349.
-
(1973)
J. Gen. Chem. USSR (Engl. Transl.)
, vol.43
, pp. 2349
-
-
Mizrakh, L.I.1
Babushkina, T.A.2
Yakovlev, V.G.3
Kozlova, L.N.4
Yukhno, E.M.5
Starostina, L.N.6
Yanochkina, G.A.7
-
34
-
-
0012466285
-
-
(a) Blackburn, G. M.; Ingleson, D. J. Chem. Soc., Chem. Commun. 1978, 20, 870.
-
(1978)
J. Chem. Soc., Chem. Commun.
, vol.20
, pp. 870
-
-
Blackburn, G.M.1
Ingleson, D.2
-
35
-
-
0028304987
-
-
(b) Charvet, A.-S.; Camplo, M.; Faury, P.; Graciet, J.-C.; Mourier, N.; Chermann, J.-C.; Kraus, J.-L. J. Med. Chem. 1994, 37, 2216.
-
(1994)
J. Med. Chem.
, vol.37
, pp. 2216
-
-
Charvet, A.-S.1
Camplo, M.2
Faury, P.3
Graciet, J.-C.4
Mourier, N.5
Chermann, J.-C.6
Kraus, J.-L.7
-
36
-
-
0000389390
-
-
Bain, C. D.; Biebuyck, H. A.; Whitesides, G. M. Langmuir 1989, 5, 723.
-
(1989)
Langmuir
, vol.5
, pp. 723
-
-
Bain, C.D.1
Biebuyck, H.A.2
Whitesides, G.M.3
-
38
-
-
0027627017
-
-
Frey, B. L.; Hanken, D. G.; Corn, R. M. Langmuir 1993, 9, 1815.
-
(1993)
Langmuir
, vol.9
, pp. 1815
-
-
Frey, B.L.1
Hanken, D.G.2
Corn, R.M.3
-
39
-
-
0027641591
-
-
Schilling, M. L.; Katz, H. E.; Stein, S. M.; Shane, S. F.; Wilson, W. L.; Buratto, S.; Ungashe, S. B.; Taylor, G. N.; Putvinski, T. M.; Chidsey, C. E. D. Langmuir 1993, 9, 2156.
-
(1993)
Langmuir
, vol.9
, pp. 2156
-
-
Schilling, M.L.1
Katz, H.E.2
Stein, S.M.3
Shane, S.F.4
Wilson, W.L.5
Buratto, S.6
Ungashe, S.B.7
Taylor, G.N.8
Putvinski, T.M.9
Chidsey, C.E.D.10
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