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Volumn 18, Issue 7, 2003, Pages 1723-1732

Microstructural characterization of thick YBa2Cu3O7-δ films on improved rolling-assisted biaxially textured substrates

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM COMPOUNDS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; NICKEL COMPOUNDS; PULSED LASER DEPOSITION; SUBSTRATES; THICK FILMS; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN COMPOUNDS;

EID: 0043199357     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2003.0237     Document Type: Article
Times cited : (22)

References (24)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.