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Volumn 11, Issue 1 III, 2001, Pages 3359-3364

A comparison of buffer layer architectures on continuously processed YBCO coated conductors based on the IBAD YSZ process

Author keywords

Coated conductor; IBAD; TEM; YBCO

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRITICAL CURRENTS; ELECTRON DIFFRACTION; ENERGY DISPERSIVE SPECTROSCOPY; INTERFACES (MATERIALS); ION BEAM ASSISTED DEPOSITION; MICROSTRUCTURE; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM BARIUM COPPER OXIDES; ZIRCONIA;

EID: 0035268489     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919783     Document Type: Conference Paper
Times cited : (41)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.