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Volumn 11, Issue 1 III, 2001, Pages 3359-3364
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A comparison of buffer layer architectures on continuously processed YBCO coated conductors based on the IBAD YSZ process
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Author keywords
Coated conductor; IBAD; TEM; YBCO
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Indexed keywords
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
CRITICAL CURRENTS;
ELECTRON DIFFRACTION;
ENERGY DISPERSIVE SPECTROSCOPY;
INTERFACES (MATERIALS);
ION BEAM ASSISTED DEPOSITION;
MICROSTRUCTURE;
PULSED LASER DEPOSITION;
SCANNING ELECTRON MICROSCOPY;
TRANSMISSION ELECTRON MICROSCOPY;
YTTRIUM BARIUM COPPER OXIDES;
ZIRCONIA;
BUFFER LATER ARCHITECTURE;
COATED CONDUCTORS;
YTTRIA STABILIZED ZIRCONIA;
SUPERCONDUCTING FILMS;
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EID: 0035268489
PISSN: 10518223
EISSN: None
Source Type: Journal
DOI: 10.1109/77.919783 Document Type: Conference Paper |
Times cited : (41)
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References (14)
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