Axial and lateral displacement measurements of a microsphere based on the critical-angle method

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 37, Issue 7, 1998, Pages 4191-4196

  Higurashi, Eiji ^a   Sawada, Renshi ^a   Ito, Takahiro ^a  

^a NTT CORPORATION   (Japan)

Author keywords

Critical angle method; Displacement measurement; Microsphere; Optical sensor; Total internal reflection

Indexed keywords

LASER BEAMS; LIGHT REFLECTION; OPTICAL VARIABLES MEASUREMENT; SPHERES;

DISPLACEMENT MEASUREMENT; MICROSPHERE;

OPTICAL SENSORS;

EID: 0032117040     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.4191     Document Type: Article

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