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Volumn 3, Issue , 2003, Pages 1919-1922

RF actuation of capacitive MEMS switches

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC POTENTIAL; ELECTRIC SWITCHES; MICROACTUATORS;

EID: 0043092474     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (40)

References (5)
  • 1
    • 0036076195 scopus 로고    scopus 로고
    • Steady state thermal analysis and high-power reliability considerations of RF MEMS capacitive switches
    • June 2
    • J. B. Rizk, E. Chaiban, and G. M. Rebeiz, Steady state Thermal Analysis and High-Power Reliability Considerations of RF MEMS Capacitive Switches, Microwave Symposium Digest. IEEE MTT-S International Meeting: June 2, 2002, pp. 239 - 242.
    • (2002) Microwave Symposium Digest. IEEE MTT-S International Meeting , pp. 239-242
    • Rizk, J.B.1    Chaiban, E.2    Rebeiz, G.M.3
  • 3
    • 0027989013 scopus 로고    scopus 로고
    • Self-consistent simulation and modeling of electrostatically deormed diaphragms
    • Oiso, Japan
    • P. Osterberg, H. Yie, X. Cai, J. White, and S. Senturia, Self-consistent simulation and modeling of electrostatically deormed diaphragms, in Proc. MEMS 94, Oiso, Japan, pp. 28-32.
    • Proc. MEMS 94 , pp. 28-32
    • Osterberg, P.1    Yie, H.2    Cai, X.3    White, J.4    Senturia, S.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.