Electrical characteristics of metal/semiconductor nanocontacts using light emission in a scanning tunneling microscope

Journal of Applied Physics

Volumn 94, Issue 3, 2003, Pages 1979-1982

  Maurel, C ^a   Coratger, R ^a   Ajustron, F ^a   Beauvillain, J ^a   Gerard, P ^b  

^a CEMES CNRS   (France)

^b INSA   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRIC CONTACTS; ELECTRIC RESISTANCE; GOLD; LEAKAGE CURRENTS; LIGHT EMISSION; RECTIFYING CIRCUITS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR JUNCTIONS;

NANOCONTACTS;

NANOSTRUCTURED MATERIALS;

EID: 0043012025     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1591056     Document Type: Article

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