Surface roughness factor of anodic oxide layer for electrolytic capacitors

Materials Chemistry and Physics

Volumn 82, Issue 2, 2003, Pages 331-334

  Oh, Han Jun ^a   Park, Gyeong Su ^b   Kim, Jung Gu ^c   Jeong, Yongsoo ^d   Chi, Choong Soo ^e  

^a Hanseo University   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^c Sungkyunkwan University   (South Korea)

^d Korea Institute of Machine and Materials   (South Korea)

^e Kookmin University   (South Korea)

Author keywords

Aluminum oxide; Capacitance; Dielectric properties; Electrochemical techniques

Indexed keywords

ALUMINUM COMPOUNDS; ANODIC OXIDATION; DIELECTRIC PROPERTIES; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; PLATINUM; SPUTTERING; SURFACE ROUGHNESS;

ANODIC OXIDE LAYERS;

ELECTROLYTIC CAPACITORS;

EID: 0043011801     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(03)00139-1     Document Type: Article

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