Electrochemical evaluation of a new type of corrosion passivation layer: Artificially produced Al2O3 films on aluminum

Langmuir

Volumn 14, Issue 9, 1998, Pages 2502-2507

  Kuznetsova, A ^a   Burleigh, T D ^a   Zhukov, V ^a   Blachere, J ^a   Yates Jr , J T ^a  

^a UNIVERSITY OF PITTSBURGH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM; AUGER ELECTRON SPECTROSCOPY; CERAMIC COATINGS; CORROSION PROTECTION; ELECTRIC RESISTANCE; ELECTRONS; FILM GROWTH; PASSIVATION; POLYCRYSTALLINE MATERIALS; X RAY DIFFRACTION ANALYSIS;

GRAZING INCIDENCE X RAY DIFFRACTION (GAXRD) ANALYSIS;

AMORPHOUS FILMS;

EID: 0032048836     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la971322s     Document Type: Article

References (13)

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