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Volumn 6, Issue 2, 2003, Pages 30-37
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Tour de force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
OPTICAL MICROSCOPY;
POLYMERS;
SCANNING;
SCANNING PROBE MICROSCOPY (SPM);
MICROSCOPIC EXAMINATION;
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EID: 0042994115
PISSN: 13697021
EISSN: None
Source Type: Journal
DOI: 10.1016/S1369-7021(03)00233-5 Document Type: Review |
Times cited : (6)
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References (28)
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