Evaluation of tip performance by XE-100 atomic force microscopy (AFM)

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 1240-1241

  Lee, Jun S ^a   Kwon, Joonhyung ^b   Park, Sang Il ^b   Sung, Changmo ^a  

^a UNIVERSITY OF MASSACHUSETTS LOWELL   (United States)

^b PSIA Corporation   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042921413     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603446205     Document Type: Conference Paper

References (4)

1. H.-Y. Nie and N. S. McIntyre, Langmuir, 17 (2001) 432.
2. J. S. Villarrubia, J. Res. Natl. Inst. Stand. Tehnol., 102 (1997) 425.
3. S. Dongmo, et al., J. Vac. Sci. Teclmol. B 14 (1996) 1552
4. Joonhyung Kwon, et al., Review of Scientific Instruments, October (2002).