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Volumn 83, Issue 1, 2003, Pages 189-191
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Model of transport nonuniversality in thick-film resistors
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CONDUCTANCE;
GRAIN SIZE AND SHAPE;
MICROSTRUCTURE;
RESISTORS;
THICK-FILM RESISTORS (TFR);
THICK FILM DEVICES;
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EID: 0042842353
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1590733 Document Type: Article |
Times cited : (6)
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References (24)
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