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Volumn 42, Issue 19, 2003, Pages 4037-4044

Ion-beam etching for the precise manufacture of optical coatings

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING; ION BEAMS; MULTILAYERS; SPUTTERING; THIN FILMS;

EID: 0042810716     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.42.004037     Document Type: Article
Times cited : (16)

References (14)
  • 1
    • 0041295367 scopus 로고
    • Modern computational methods for optical thin film systems
    • J. A. Dobrowolski, “Modern computational methods for optical thin film systems,” Thin Solid Films 34, 313-321 (1976).
    • (1976) Thin Solid Films , vol.34 , pp. 313-321
    • Dobrowolski, J.A.1
  • 3
    • 0043042507 scopus 로고    scopus 로고
    • 2001 Optical Society of America Topical Meeting on Optical Coatings: Manufacturing Problem
    • J. A. Dobrowolski, S. Browning, M. Jacobson, and M. Nadal, “2001 Optical Society of America Topical Meeting on Optical Coatings: Manufacturing Problem,” Appl. Opt. 41, 1-14 (2002).
    • (2002) Appl. Opt. , vol.41 , pp. 1-14
    • Dobrowolski, J.A.1    Browning, S.2    Jacobson, M.3    Nadal, M.4
  • 4
    • 84975564161 scopus 로고
    • Ion beam milling as a diagnostic for optical coatings
    • W. C. Herrman, Jr., and J. R. McNeil, “Ion beam milling as a diagnostic for optical coatings,” Appl. Opt. 20, 1899-1901 (1981).
    • (1981) Appl. Opt , vol.20 , pp. 1899-1901
    • Herrman, W.C.1    Mc Neil, J.R.2
  • 6
    • 0036603398 scopus 로고    scopus 로고
    • Black layer coatings for the photolithographic manufacture of diffraction gratings
    • D. Poitras, J. A. Dobrowolski, T. Cassidy, C. Midwinter, and C. T. McElroy, “Black layer coatings for the photolithographic manufacture of diffraction gratings,” Appl. Opt. 41, 3306-3311 (2002).
    • (2002) Appl. Opt , vol.41 , pp. 3306-3311
    • Poitras, D.1    Dobrowolski, J.A.2    Cassidy, T.3    Midwinter, C.4    Mc Elroy, C.T.5
  • 10
    • 85010131741 scopus 로고    scopus 로고
    • presented at the Photometry, Radiometry, Colorimetry Lectures, Institute for National Measurement Standards, National Research Council of Canada, Ottawa, Canada, 9-12 April
    • J. C. Zwinkels, “Basics of spectrophotometry,” presented at the Photometry, Radiometry, Colorimetry Lectures, Institute for National Measurement Standards, National Research Council of Canada, Ottawa, Canada, 9-12 April 2002.
    • (2002) Basics of Spectrophotometry
    • Zwinkels, J.C.1
  • 12
    • 84975567716 scopus 로고
    • Interferometric measurements of femtosecond group delay in optical components
    • W. H. Knox, N. M. Pearson, K. D. Li, and C. A. Hirlimann, “Interferometric measurements of femtosecond group delay in optical components,” Opt. Lett. 13, 574-576 (1988).
    • (1988) Opt. Lett. , vol.13 , pp. 574-576
    • Knox, W.H.1    Pearson, N.M.2    Li, K.D.3    Hirlimann, C.A.4
  • 13
    • 84893893654 scopus 로고    scopus 로고
    • Asymmetrical dualcavity filters: Theory and application
    • OSA Trends in Optics and Photonics Series (Optical Society of America, Washington, D.C
    • D. Poitras, T. Cassidy, and S. Guetre, “Asymmetrical dualcavity filters: theory and application,” in Optical Interference Coatings, Vol. 63 of OSA Trends in Optics and Photonics Series (Optical Society of America, Washington, D.C., 2001), pp. MD3-1-MD3-3.
    • (2001) Optical Interference Coatings , vol.63 , pp. MD3-1-MD3-3
    • Poitras, D.1    Cassidy, T.2    Guetre, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.