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Volumn 4881, Issue , 2002, Pages 345-354

Comparison of ultraviolet Bi-directional Reflectance Distribution Function (BRDF) measurements of diffusers used in the calibration of the Total Ozone Mapping Spectrometer (TOMS)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; EARTH (PLANET); OZONE; SATELLITES;

EID: 0042731610     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.463013     Document Type: Conference Paper
Times cited : (7)

References (9)
  • 1
    • 0041330075 scopus 로고    scopus 로고
    • note
    • Certain commercial equipment, instruments, or materials are identified in this paper to foster understanding. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology or by the National Aeronautics and Space Administration, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.
  • 2
    • 0000785537 scopus 로고    scopus 로고
    • Radiometric calibration of second generation total ozone mapping spectrometer (TOMS)
    • H. Park, A. Krueger, E. Hilsenrath, G. Jaross, and R. Haring, "Radiometric Calibration of Second Generation Total Ozone Mapping Spectrometer (TOMS)," Proc. SPIE, 2820, 162-173 (1996).
    • (1996) Proc. SPIE , vol.2820 , pp. 162-173
    • Park, H.1    Krueger, A.2    Hilsenrath, E.3    Jaross, G.4    Haring, R.5
  • 3
    • 0007399770 scopus 로고    scopus 로고
    • Sensitivity of total ozone mapping spectrometer products to diffuse reflectance measurements
    • G. Jaross, A.J. Krueger, and C. Wellemeyer, "Sensitivity of Total Ozone Mapping Spectrometer Products to Diffuse Reflectance Measurements," Metrologia, 35, 663-668 (1998).
    • (1998) Metrologia , vol.35 , pp. 663-668
    • Jaross, G.1    Krueger, A.J.2    Wellemeyer, C.3
  • 4
    • 0004207207 scopus 로고    scopus 로고
    • Geometrical considerations and nomenclature for reflectance
    • U.S. Department of Commerce, National Bureau of Standards
    • F.E. Nicodemus, J.C. Richmond, J.J Hsia, I.W. Ginsberg, and T. Limperis, "Geometrical Considerations and Nomenclature for Reflectance," NBS Monograph, No. 160, U.S. Department of Commerce, National Bureau of Standards, 52 pp.
    • NBS Monograph, No. 160 , vol.160 , pp. 52
    • Nicodemus, F.E.1    Richmond, J.C.2    Hsia, J.J.3    Ginsberg, I.W.4    Limperis, T.5
  • 5
    • 0007397977 scopus 로고    scopus 로고
    • ASTM E1392-90, standard practice for angle resolved optical scatter measurements on specular or diffuse surfaces
    • American Society for Testing and Materials
    • th ed., American Society for Testing and Materials, 439-448 (1997).
    • (1997) th Ed. , pp. 439-448
  • 6
    • 0002727477 scopus 로고    scopus 로고
    • Guidelines for evaluating and expressing the uncertainty of nist measurement results
    • U.S. Department of Commerce, National Institute of Standards and Technology
    • B.N. Taylor and C.E. Kuyatt, "Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results," NIST Technical Note 1297, U.S. Department of Commerce, National Institute of Standards and Technology, 20 pp.
    • NIST Technical Note , vol.1297 , pp. 20
    • Taylor, B.N.1    Kuyatt, C.E.2
  • 7
    • 0000580493 scopus 로고    scopus 로고
    • NIST high accuracy reference reflectometer-spectrophotometer
    • J.E. Proctor and P.Y. Barnes, "NIST High Accuracy Reference Reflectometer-spectrophotometer," J. Res. Natl. Inst. Stand. Technol., 101, 619-627 (1996).
    • (1996) J. Res. Natl. Inst. Stand. Technol. , vol.101 , pp. 619-627
    • Proctor, J.E.1    Barnes, P.Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.