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1
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0041330075
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note
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Certain commercial equipment, instruments, or materials are identified in this paper to foster understanding. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology or by the National Aeronautics and Space Administration, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.
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2
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0000785537
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Radiometric calibration of second generation total ozone mapping spectrometer (TOMS)
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H. Park, A. Krueger, E. Hilsenrath, G. Jaross, and R. Haring, "Radiometric Calibration of Second Generation Total Ozone Mapping Spectrometer (TOMS)," Proc. SPIE, 2820, 162-173 (1996).
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(1996)
Proc. SPIE
, vol.2820
, pp. 162-173
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Park, H.1
Krueger, A.2
Hilsenrath, E.3
Jaross, G.4
Haring, R.5
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3
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0007399770
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Sensitivity of total ozone mapping spectrometer products to diffuse reflectance measurements
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G. Jaross, A.J. Krueger, and C. Wellemeyer, "Sensitivity of Total Ozone Mapping Spectrometer Products to Diffuse Reflectance Measurements," Metrologia, 35, 663-668 (1998).
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(1998)
Metrologia
, vol.35
, pp. 663-668
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Jaross, G.1
Krueger, A.J.2
Wellemeyer, C.3
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4
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0004207207
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Geometrical considerations and nomenclature for reflectance
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U.S. Department of Commerce, National Bureau of Standards
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F.E. Nicodemus, J.C. Richmond, J.J Hsia, I.W. Ginsberg, and T. Limperis, "Geometrical Considerations and Nomenclature for Reflectance," NBS Monograph, No. 160, U.S. Department of Commerce, National Bureau of Standards, 52 pp.
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NBS Monograph, No. 160
, vol.160
, pp. 52
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Nicodemus, F.E.1
Richmond, J.C.2
Hsia, J.J.3
Ginsberg, I.W.4
Limperis, T.5
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5
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0007397977
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ASTM E1392-90, standard practice for angle resolved optical scatter measurements on specular or diffuse surfaces
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American Society for Testing and Materials
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th ed., American Society for Testing and Materials, 439-448 (1997).
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(1997)
th Ed.
, pp. 439-448
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6
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0002727477
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Guidelines for evaluating and expressing the uncertainty of nist measurement results
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U.S. Department of Commerce, National Institute of Standards and Technology
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B.N. Taylor and C.E. Kuyatt, "Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results," NIST Technical Note 1297, U.S. Department of Commerce, National Institute of Standards and Technology, 20 pp.
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NIST Technical Note
, vol.1297
, pp. 20
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Taylor, B.N.1
Kuyatt, C.E.2
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7
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0000580493
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NIST high accuracy reference reflectometer-spectrophotometer
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J.E. Proctor and P.Y. Barnes, "NIST High Accuracy Reference Reflectometer-spectrophotometer," J. Res. Natl. Inst. Stand. Technol., 101, 619-627 (1996).
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(1996)
J. Res. Natl. Inst. Stand. Technol.
, vol.101
, pp. 619-627
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Proctor, J.E.1
Barnes, P.Y.2
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8
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0029463705
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Absolute radiometric calibration facility
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C. Smorenburg, A.L.G. van Valkenburg, and H.G.C. Werij, "Absolute Radiometric Calibration Facility," Proc. SPIE, 2583, 166-177 (1995).
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(1995)
Proc. SPIE
, vol.2583
, pp. 166-177
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Smorenburg, C.1
Van Valkenburg, A.L.G.2
Werij, H.G.C.3
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9
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33947626278
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Design review of a high accuracy UV to near IR scatterometer
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T.F. Schiff, M.W. Knighton, D.J. Wilson, F.M. Cady, J.C. Stover, and J.J. Butler, "Design Review of a High Accuracy UV to Near IR Scatterometer," Proc. SPIE, 1995, 121-130 (1993).
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(1993)
Proc. SPIE
, vol.1995
, pp. 121-130
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Schiff, T.F.1
Knighton, M.W.2
Wilson, D.J.3
Cady, F.M.4
Stover, J.C.5
Butler, J.J.6
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