Sensitivity of Total Ozone Mapping Spectrometer products to diffuse reflectance measurements

Metrologia

Volumn 35, Issue 4, 1998, Pages 663-668

  Jaross, G ^a   Krueger, A J ^b   Wellemeyer, C ^a  

^a RAYTHEON COMPANY   (United States)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007399770     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/35/4/75     Document Type: Article

References (18)

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