Reply to comment: Absolute measurement of roughness and lateral-correlation length of random surfaces by use of the simplified model of image-speckle contrast

Applied Optics

Volumn 42, Issue 14, 2003, Pages 2523-2525

  Cheng, Chuanfu ^a   Liu, Chunxiang ^b   Zhang, Ningyu ^c   Jia, Tianqing ^a   Li, Ruxin ^a   Xu, Zhizhan ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^b SHANDONG NORMAL UNIVERSITY   (China)

^c SHANDONG JIANZHU UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; SCATTERING; SURFACE ROUGHNESS;

LATERAL-CORRELATION LENGTH;

SPECKLE;

EID: 0042594448     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.42.002523     Document Type: Article

References (9)

1. H. T. Yura and S. G. Hanson, “Comment to: Absolute measurement of roughness and lateral-correlation length of random surfaces by use of the simplified model of image-speckle contrast,” Appl. Opt. 42, 2521-2522 (2003).
2. Chuanfu Cheng, Chunxiang Liu, Ningyu Zhang, Tianqing Jia, Ruxin Li, and Zhizhan Xu, “Absolute measurement of roughness and lateral-correlation length of random surfaces by use of the simplified model of image-speckle contrast,” Appl. Opt. 41, 4148-4156 (2002).
3. J. W. Goodman, “Dependence of image speckle contrast on surface roughness,” Opt. Commun. 14, 324-327 (1975).
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5. J. W. Goodman, Statistical Optics, (John Wiley & Sons, New York, 1985) p. 108.
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8. J. Ohtsubo and T. Asakura, “Statistical properties of laser speckle produced in the diffraction field,” Appl. Opt. 16, 1742-1753 (1977).
9. J. M. Elson, H. E. Bennett, J. M. Bennett, “Scattering from optical surfaces,”in Applied Optics and Optical Engineering, R. R. Shannon and J. C. Wyant, eds. (Academic, New York, 1979) Chap. 7.