Comment: Absolute measurement of roughness and lateral-correlation length of random surfaces by use of the simplified model of image-speckle contrast

Applied Optics

Volumn 42, Issue 14, 2003, Pages 2521-2522

  Yura, H T ^a   Hanson, S G ^b  

^a AEROSPACE CORPORATION   (United States)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; LIGHT TRANSMISSION; SCATTERING;

IMAGE-SPECKLE CONTRAST;

SPECKLE;

EID: 0043033151     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.42.002521     Document Type: Article

References (3)

1. C. Cheng, C. Liu, N. Zhang, T. Jia, R. Li, and Z. Xu, “Absolute measurement of roughness and lateral- correlation length of random surfaces by use of the simplified model of image-speckle contrast,” Appl. Opt. 41, 4148-4156 (2002).
2. J. W. Goodman, “Statistical properties of laser speckle patterns,” in Laser Speckle and Related Phenomena, J. C. Dainty, ed (Springer-Verlag, Berlin 1984). Chap. 2.
3. J. M. Elson, H. E. Bennett, J. M. Bennett, “Scattering from Optical Surfaces,”in Applied Optics and Optical Engineering, R. R. Shannon and J. C. Wyant, eds., (Academic, New York, 1979) Chap. 7, pp. 191-244.