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Volumn 2, Issue , 2003, Pages 1287-1290
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High-Q RF inductors on standard silicon realized using wafer-level packaging techniques
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELECTRONICS PACKAGING;
NATURAL FREQUENCIES;
PASSIVATION;
Q FACTOR MEASUREMENT;
SILICON WAFERS;
WAFER-LEVEL PACKAGING (WLP);
ELECTRIC INDUCTORS;
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EID: 0042593026
PISSN: 0149645X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (6)
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References (8)
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