A SiGe 10-Gb/s multi-pattern bit error rate tester

IEEE Radio Frequency Integrated Circuits Symposium, RFIC, Digest of Technical Papers

Volumn , Issue , 2003, Pages 321-324

  Malasani, Rammohan ^a   Bourdé, Christian ^a   Gutierrez, Germán ^a  

^a Centellax Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; ERROR DETECTION; MIM DEVICES; SILICON COMPOUNDS; SYNCHRONIZATION;

CLOCK DATA RECOVERY (CDR);

MONOLITHIC INTEGRATED CIRCUITS;

EID: 0042591138     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. O. Kromat et al "A 10 Gb/s silicon bipolar IC for PRBS testing." In Int. Solid-state Circuits Conf. (ISSCC) 1996, Dig. Tech. Papers, pp. 206-207
2. R. Westcott, "Testing digital data transmission systems," U.K. Patent 1 281 390, 1972.
3. D. Knoll, B. Heinemann, K.E. Ehwald, H. Rücker, B. Tillack, W. Winkler, and P. Schley, "BiCMOS Integration of SiGe:C Heterojunction Bipolar Transistors," 2002 IEEE Bipolar/Bicmos Circuits and Technology Meeting Proceedings, pp. 162-166.