Angstrom–range optical path–length measurement with a high–speed scanning heterodyne optical interferometer

Applied Optics

Volumn 42, Issue 13, 2003, Pages 2341-2345

  Riza, Nabeel A ^a   Arain, Muzammil A ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL RESOLVING POWER; REFRACTIVE INDEX; SCANNING; THICKNESS MEASUREMENT;

REFLECTIVE GEOMETRY;

INTERFEROMETERS;

EID: 0042472783     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.42.002341     Document Type: Article

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