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Volumn 75, Issue 2-3, 2000, Pages 103-109

Applications of defect engineering in InP-based structures

Author keywords

Defects; Doping; Engineering; Heterostructures; InP; MBE

Indexed keywords


EID: 0042418278     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(00)00342-1     Document Type: Article
Times cited : (5)

References (17)
  • 1
    • 0347202191 scopus 로고
    • Low Temperature (LT) GaAs and Related Materials
    • G.L. Witt, R. Calawa, U. Mishra, E. Weber (Eds.), Materials Research Society, Pittsburgh, PA
    • G.L. Witt, R. Calawa, U. Mishra, E. Weber (Eds.), Low Temperature (LT) GaAs and Related Materials, MRS Symposium Proceedings, Vol. 241, Materials Research Society, Pittsburgh, PA, 1992.
    • (1992) MRS Symposium Proceedings , vol.241
  • 17
    • 0347202191 scopus 로고
    • Low Temperature (LT) GaAs and Related Materials
    • G.L. Witt, R. Calawa, U. Mishara, E. Weber (Eds.), Materials Research Society, Pittsburgh, PA
    • B.W. Liang, Y. He, C.W. Tu, in: G.L. Witt, R. Calawa, U. Mishara, E. Weber (Eds.), Low Temperature (LT) GaAs and Related Materials, MRS Symposia Proceedings 241, Materials Research Society, Pittsburgh, PA, 1992, p. 297.
    • (1992) MRS Symposia Proceedings , vol.241 , pp. 297
    • Liang, B.W.1    He, Y.2    Tu, C.W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.