메뉴 건너뛰기




Volumn 29, Issue 4, 2002, Pages 541-545

ZnSe films deposited on crystalline GaAs and amorphous quartz substrates by means of pulsed laser ablation technique

Author keywords

61.10.Eq X ray scattering; 78.40.Fy Semiconductors; 78.55.Et II VI semiconductors

Indexed keywords


EID: 0042306180     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1140/epjb/e2002-00337-0     Document Type: Article
Times cited : (8)

References (22)
  • 8
    • 0042101107 scopus 로고    scopus 로고
    • note
    • 2 is the Gaussian width and a3 is proportional to the ratio of Lorentzian and Gaussian width


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.