-
1
-
-
0027574951
-
-
Shen Y.-F.; Zerger, R. P.; DeGuzman, R. N.; Suib, S. L.; McCurdy, L.; Potter, D. I.; O'Young, C. L. Science 1993, 260, 511.
-
(1993)
Science
, vol.260
, pp. 511
-
-
Shen, Y.-F.1
Zerger, R.P.2
DeGuzman, R.N.3
Suib, S.L.4
McCurdy, L.5
Potter, D.I.6
O'Young, C.L.7
-
3
-
-
0032901527
-
-
Feng, Q.; Kanoh, H.; Ooi, K. J. Mater. Chem. 1999, 9, 319.
-
(1999)
J. Mater. Chem.
, vol.9
, pp. 319
-
-
Feng, Q.1
Kanoh, H.2
Ooi, K.3
-
4
-
-
0035859436
-
-
Brock, S. L.; Sanabria, M.; Nair, J.; Suib, S. L.; Ressler, T. J. Phys. Chem. B 2001, 105, 5404.
-
(2001)
J. Phys. Chem. B
, vol.105
, pp. 5404
-
-
Brock, S.L.1
Sanabria, M.2
Nair, J.3
Suib, S.L.4
Ressler, T.5
-
6
-
-
4243275171
-
-
Rao, C. N. R.; Cheetham, A. K.; Mahesh, R. Chem. Mater. 1996, 8, 2241.
-
(1996)
Chem. Mater.
, vol.8
, pp. 2241
-
-
Rao, C.N.R.1
Cheetham, A.K.2
Mahesh, R.3
-
7
-
-
0028445811
-
-
Tarascon, J. M.; Mckinnon, W. R.; Coowar, F.; Bowmer, T. N.; Amatucci, G.; Guyomard, D. J. Electrochem. Soc. 1994, 141, 1421.
-
(1994)
J. Electrochem. Soc.
, vol.141
, pp. 1421
-
-
Tarascon, J.M.1
Mckinnon, W.R.2
Coowar, F.3
Bowmer, T.N.4
Amatucci, G.5
Guyomard, D.6
-
8
-
-
0001516774
-
-
(a) Ching, S.; Petrovay, D. J.; Jorgensen, M. L.; Suib, S. L. Inorg. Chem. 1997, 36, 883.
-
(1997)
Inorg. Chem.
, vol.36
, pp. 883
-
-
Ching, S.1
Petrovay, D.J.2
Jorgensen, M.L.3
Suib, S.L.4
-
9
-
-
0000307857
-
-
(b) Feng, Q.; Honbu, C.; Yanagisawa, K.; Yamasaki, N. Chem. Mater. 1999, 11, 2444.
-
(1999)
Chem. Mater.
, vol.11
, pp. 2444
-
-
Feng, Q.1
Honbu, C.2
Yanagisawa, K.3
Yamasaki, N.4
-
10
-
-
0035640203
-
-
(c) Yang, X.-J.; Kanoh, H.; Tang, W.-P.; Liu, Z.-H.; Ooi, K. Chem. Lett. 2001, 612.
-
(2001)
Chem. Lett.
, pp. 612
-
-
Yang, X.-J.1
Kanoh, H.2
Tang, W.-P.3
Liu, Z.-H.4
Ooi, K.5
-
11
-
-
0033747154
-
-
(d) Liu, Z.-H.; Ooi, K.; Kanoh, H.; Tang, W.-P.; Tomida, T. Langmuir 2000, 16, 4154.
-
(2000)
Langmuir
, vol.16
, pp. 4154
-
-
Liu, Z.-H.1
Ooi, K.2
Kanoh, H.3
Tang, W.-P.4
Tomida, T.5
-
12
-
-
0031560768
-
-
Tian, Z.-R.; Tong, W.; Wang, J.-Y.; Duan, N.-G.; Krishnan, V. V.; Suib, S. L. Science 1997, 276, 926.
-
(1997)
Science
, vol.276
, pp. 926
-
-
Tian, Z.-R.1
Tong, W.2
Wang, J.-Y.3
Duan, N.-G.4
Krishnan, V.V.5
Suib, S.L.6
-
13
-
-
0000723370
-
-
Ma, Y.; Suib, S. L.; Ressler, T.; Wong, J.; Lovallo, M.; Tsapatsis, M. Chem. Mater. 1999, 11, 3545.
-
(1999)
Chem. Mater.
, vol.11
, pp. 3545
-
-
Ma, Y.1
Suib, S.L.2
Ressler, T.3
Wong, J.4
Lovallo, M.5
Tsapatsis, M.6
-
14
-
-
0033787293
-
-
Floros, N.; Michel, C.; Hervieu, M.; Raveau, B. Chem. Mater. 2000, 12, 3197.
-
(2000)
Chem. Mater.
, vol.12
, pp. 3197
-
-
Floros, N.1
Michel, C.2
Hervieu, M.3
Raveau, B.4
-
16
-
-
0001917309
-
-
(a) Segal, S. R.; Park, S. H.; Suib, S. L. Chem. Mater. 1997, 9, 98.
-
(1997)
Chem. Mater.
, vol.9
, pp. 98
-
-
Segal, S.R.1
Park, S.H.2
Suib, S.L.3
-
17
-
-
0026416824
-
-
(b) Bayrachny, B.; Cheremskoy, P.; Gomozov, V.; Murovzev, L.; Skatkov, L. Thin Solid Films 1991, 201, L7.
-
(1991)
Thin Solid Films
, vol.201
-
-
Bayrachny, B.1
Cheremskoy, P.2
Gomozov, V.3
Murovzev, L.4
Skatkov, L.5
-
18
-
-
0033814415
-
-
(a) Nishizawa, M.; Ise, T.; Koshika, H.; Itoh, T.; Uchida, I. Chem. Mater. 2000, 12, 1367.
-
(2000)
Chem. Mater.
, vol.12
, pp. 1367
-
-
Nishizawa, M.1
Ise, T.2
Koshika, H.3
Itoh, T.4
Uchida, I.5
-
20
-
-
0035922508
-
-
Long, J. W.; Qadir, L. R.; Stroud, R. M.; Rolison, D. R. J. Phys. Chem. B 2001, 105, 8712.
-
(2001)
J. Phys. Chem. B
, vol.105
, pp. 8712
-
-
Long, J.W.1
Qadir, L.R.2
Stroud, R.M.3
Rolison, D.R.4
-
21
-
-
0031380513
-
-
Kanoh, H.; Tang, W.-P.; Makita, Y.; Ooi, K. Langmuir 1997, 13, 6845.
-
(1997)
Langmuir
, vol.13
, pp. 6845
-
-
Kanoh, H.1
Tang, W.-P.2
Makita, Y.3
Ooi, K.4
-
22
-
-
0033361964
-
-
Ratieuville, Y.; Wu, W.-L.; Lincot, D.; Vedel, J.; Yu, L.-T. J. Electrochem. Soc. 1999, 146, 3161.
-
(1999)
J. Electrochem. Soc.
, vol.146
, pp. 3161
-
-
Ratieuville, Y.1
Wu, W.-L.2
Lincot, D.3
Vedel, J.4
Yu, L.-T.5
-
23
-
-
0034140944
-
-
(a) Pang, S.-C.; Anderson, M. A.; Chapman, T. W. J. Electrochem. Soc. 2000, 147, 444.
-
(2000)
J. Electrochem. Soc.
, vol.147
, pp. 444
-
-
Pang, S.-C.1
Anderson, M.A.2
Chapman, T.W.3
-
25
-
-
0034721461
-
-
Giraldo, O.; Brock, S. L.; Willis, W. S.; Marquez, M.; Suib, S. L. J. Am. Chem. Soc. 2000, 122, 9330.
-
(2000)
J. Am. Chem. Soc.
, vol.122
, pp. 9330
-
-
Giraldo, O.1
Brock, S.L.2
Willis, W.S.3
Marquez, M.4
Suib, S.L.5
-
26
-
-
0030848621
-
-
(a) Decher, G. Science 1997, 277, 1232.
-
(1997)
Science
, vol.277
, pp. 1232
-
-
Decher, G.1
-
28
-
-
0032511370
-
-
(c) Cassagneau, T.; Fendler, J. H.; Mallouk, T. E. J. Am. Chem. Soc. 1998, 120, 7848.
-
(1998)
J. Am. Chem. Soc.
, vol.120
, pp. 7848
-
-
Cassagneau, T.1
Fendler, J.H.2
Mallouk, T.E.3
-
30
-
-
21944432746
-
-
Brock, S. L.; Sanabria, M.; Suib, S. L.; Urban, V.; Thiyagarajan, P.; Potter, D. I. J. Phys. Chem. B 1999, 103, 7416.
-
(1999)
J. Phys. Chem. B
, vol.103
, pp. 7416
-
-
Brock, S.L.1
Sanabria, M.2
Suib, S.L.3
Urban, V.4
Thiyagarajan, P.5
Potter, D.I.6
-
31
-
-
0034322806
-
-
Lvov, Y.; Munge, B.; Giraldo, O.; Ichinose, I.; Suib, S. L.; Rusling, J. F. Langmuir 2000, 16, 8850.
-
(2000)
Langmuir
, vol.16
, pp. 8850
-
-
Lvov, Y.1
Munge, B.2
Giraldo, O.3
Ichinose, I.4
Suib, S.L.5
Rusling, J.F.6
-
32
-
-
0036858976
-
-
(a) Omomo, Y.; Sasaki, T.; Watanabe, M. Solid State Ionics 2002, 151, 243.
-
(2002)
Solid State Ionics
, vol.151
, pp. 243
-
-
Omomo, Y.1
Sasaki, T.2
Watanabe, M.3
-
33
-
-
0037467374
-
-
(b) Omomo, Y.; Sasaki, T.; Wang, L. Z.; Watanabe, M. J. Am. Chem. Soc. 2003, 125, 3568.
-
(2003)
J. Am. Chem. Soc.
, vol.125
, pp. 3568
-
-
Omomo, Y.1
Sasaki, T.2
Wang, L.Z.3
Watanabe, M.4
-
34
-
-
0000939174
-
-
(a) Keller, S. W.; Kim, H.-N.; Mallouk, T. E. J. Am. Chem. Soc. 1994, 116, 8817.
-
(1994)
J. Am. Chem. Soc.
, vol.116
, pp. 8817
-
-
Keller, S.W.1
Kim, H.-N.2
Mallouk, T.E.3
-
35
-
-
0031576690
-
-
(b) Fang, M.-M.; Kaschak, D. M.; Sutorik, A. C.; Mallouk, T. E. J. Am. Chem. Soc. 1997, 119, 12184.
-
(1997)
J. Am. Chem. Soc.
, vol.119
, pp. 12184
-
-
Fang, M.-M.1
Kaschak, D.M.2
Sutorik, A.C.3
Mallouk, T.E.4
-
37
-
-
0342666235
-
-
(a) Cassagneau, T.; Guérin, F.; Fendler, J. H. Langmuir, 2000, 16, 7318.
-
(2000)
Langmuir
, vol.16
, pp. 7318
-
-
Cassagneau, T.1
Guérin, F.2
Fendler, J.H.3
-
38
-
-
0030218359
-
-
(b) Kotov, N. A.; Dékány, I.; Fendler, J. H. Adv. Mater. 1996, 8, 637.
-
(1996)
Adv. Mater.
, vol.8
, pp. 637
-
-
Kotov, N.A.1
Dékány, I.2
Fendler, J.H.3
-
39
-
-
0001630536
-
-
(c) Kotov, N. A.; Magonov, S.; Tropsha, E. Chem. Mater. 1998, 10, 886.
-
(1998)
Chem. Mater.
, vol.10
, pp. 886
-
-
Kotov, N.A.1
Magonov, S.2
Tropsha, E.3
-
40
-
-
0034619642
-
-
(a) Sasaki, T.; Ebina, Y.; Watanabe, M.; Decher, G. Chem. Commun. 2000, 2163.
-
(2000)
Chem. Commun.
, pp. 2163
-
-
Sasaki, T.1
Ebina, Y.2
Watanabe, M.3
Decher, G.4
-
41
-
-
0035672247
-
-
(b) Sasaki, T.; Ebina, Y.; Tanaka, T.; Harada, M.; Watanabe, M.; Decher, G. Chem. Mater. 2001, 13, 4661.
-
(2001)
Chem. Mater.
, vol.13
, pp. 4661
-
-
Sasaki, T.1
Ebina, Y.2
Tanaka, T.3
Harada, M.4
Watanabe, M.5
Decher, G.6
-
42
-
-
0036678647
-
-
(c) Sasaki, T.; Ebina, Y.; Fukuda, K.; Tanaka, T.; Harada, M.; Watanabe, M. Chem. Mater. 2002, 14, 3524.
-
(2002)
Chem. Mater.
, vol.14
, pp. 3524
-
-
Sasaki, T.1
Ebina, Y.2
Fukuda, K.3
Tanaka, T.4
Harada, M.5
Watanabe, M.6
-
45
-
-
0000870160
-
-
Ressler, T.; Brock, S. L.; Wong, J.; Suib, S. L. J. Phys. Chem. B 1999, 103, 6407.
-
(1999)
J. Phys. Chem. B
, vol.103
, pp. 6407
-
-
Ressler, T.1
Brock, S.L.2
Wong, J.3
Suib, S.L.4
-
46
-
-
0035124620
-
-
(a) Hwang, S.-J.; Park, H.-S.; Choy, J.-H.; Campet, G. J. Phys. Chem. B 2001, 105, 335.
-
(2001)
J. Phys. Chem. B
, vol.105
, pp. 335
-
-
Hwang, S.-J.1
Park, H.-S.2
Choy, J.-H.3
Campet, G.4
-
47
-
-
0033808388
-
-
(b) Hwang, S.-J.; Park, H.-S.; Choy, J.-H.; Campet, G. Chem. Mater. 2000, 12, 1818.
-
(2000)
Chem. Mater.
, vol.12
, pp. 1818
-
-
Hwang, S.-J.1
Park, H.-S.2
Choy, J.-H.3
Campet, G.4
-
48
-
-
0003459529
-
-
Chastain, J., Ed; Perkin-Elmer Corp.: Eden Prairie, MN
-
(a) Moulder, J.; Stickle, W.; Sobol, P.; Bomben, K. Handbook of X-ray Photoelectron Spectroscopy; Chastain, J., Ed; Perkin-Elmer Corp.: Eden Prairie, MN, 1992.
-
(1992)
Handbook of X-Ray Photoelectron Spectroscopy
-
-
Moulder, J.1
Stickle, W.2
Sobol, P.3
Bomben, K.4
-
49
-
-
0004099866
-
-
U.S. Government Printing Office: Washington, DC
-
(b) NIST X-ray Photoelectron Spectroscopy Database; U. S. Secretary of Commerce; U.S. Government Printing Office: Washington, DC, 1997.
-
(1997)
Nist X-Ray Photoelectron Spectroscopy Database
-
-
-
50
-
-
0037431972
-
-
(c) Wang, Z.-S.; Sasaki, T.; Muramastu, M.; Ebina, Y.; Tanaka, T.; Wang, L. Z.; Watanabe, M. Chem. Mater. 2003, 15, 807.
-
(2003)
Chem. Mater.
, vol.15
, pp. 807
-
-
Wang, Z.-S.1
Sasaki, T.2
Muramastu, M.3
Ebina, Y.4
Tanaka, T.5
Wang, L.Z.6
Watanabe, M.7
-
51
-
-
0036854709
-
-
Liu, Z.-H.; Yang, X.-J.; Makita, Y.; Ooi, K. Chem. Mater. 2002, 14, 4800.
-
(2002)
Chem. Mater.
, vol.14
, pp. 4800
-
-
Liu, Z.-H.1
Yang, X.-J.2
Makita, Y.3
Ooi, K.4
-
52
-
-
0041986148
-
-
JCPDS 41-1442
-
JCPDS 41-1442.
-
-
-
-
53
-
-
0041986147
-
-
note
-
a is Avogadro's number.
-
-
-
-
55
-
-
0001123382
-
-
De Guzman, R. N.; Shen, Y.-F.; Shaw, B. R.; Suib, S. L.; O'Young, C. L. Chem. Mater. 1993, 5, 1395.
-
(1993)
Chem. Mater.
, vol.5
, pp. 1395
-
-
De Guzman, R.N.1
Shen, Y.-F.2
Shaw, B.R.3
Suib, S.L.4
O'Young, C.L.5
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