Analytical model for saturable aging in semiconductor lasers

Journal of Applied Physics

Volumn 94, Issue 3, 2003, Pages 1803-1809

  Lam, S K K ^a   Mallard, R E ^b   Cassidy, Daniel T ^a  

^a MCMASTER UNIVERSITY   (Canada)

^b Bookham Technology   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; FAILURE ANALYSIS; MATHEMATICAL MODELS; THRESHOLD VOLTAGE;

THRESHOLD CURRENTS;

SEMICONDUCTOR LASERS;

EID: 0042011220     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1589594     Document Type: Article

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