Critical current limiting factors in post annealed (Bi,Pb)2Sr2Ca2Cu3Ox tapes

IEEE Transactions on Applied Superconductivity

Volumn 13, Issue 2 III, 2003, Pages 3018-3021

  Jiang, J ^a   Cai, X Y ^a   Chandler, J G ^a   Patnaik, S ^a   Polyanskii, A A ^a   Yuan, Y ^a   Hellstrom, E E ^a   Larbalestier, D C ^a  

^a University of Wisconsin Madison   (United States)

Author keywords

(Bi, Pb)2Sr2Ca2Cu3Ox tape; Bi 2223; Critical current density; Critical temperature; Post anneal

Indexed keywords

ANNEALING; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); GRAIN GROWTH; MICROSTRUCTURE;

CRITICAL TEMPERATURE;

SUPERCONDUCTING TAPES;

EID: 0041975085     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2003.812057     Document Type: Conference Paper

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