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Volumn 14, Issue 8, 2001, Pages 548-556

Through-process study of factors controlling the critical current density of Ag-sheathed (Bi,Pb)2Sr2Ca2Cu3Ox tapes

(9) Jiang, J a Cai, X Y a Polyanskii, A A a,c Schwartzkopf, L A a Larbalestier, D C b Parrella, R D b Li, Q b Rupich, M W b Riley Jr , G N b

a University of Wisconsin Madison (United States)

b AMERICAN SUPERCONDUCTOR CORPORATION (United States)

c MINNESOTA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL MICROSTRUCTURE; ELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; HEAT TREATMENT; MAGNETIC FLUX; MECHANICAL PROPERTIES; OXIDE SUPERCONDUCTORS; POROSITY; SILVER; THERMAL EFFECTS;

ELECTRICAL CONNECTIVITY; FILAMENT RESISTANCE; FLUX PINNING; MASS DENSITY MEASUREMENT; SUPERCONDUCTING PROPERTY;

SUPERCONDUCTING TAPES;

EID: 0035421994 PISSN: 09532048 EISSN: None Source Type: Journal
DOI: 10.1088/0953-2048/14/8/307 Document Type: Article

Times cited : (41)

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