메뉴 건너뛰기




Volumn 75, Issue 20, 1999, Pages 3168-3170

The use of the in-field critical current density, Jc(0.1T), as a better descriptor of (Bi, Pb)2Sr2Ca2Cu3Ox/Ag tape performance

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000508975     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125266     Document Type: Article
Times cited : (18)

References (15)
  • 13
    • 0042649196 scopus 로고
    • Ph.D. thesis, University of Wisconsin-Madison
    • H. S. Edelman, Ph.D. thesis, University of Wisconsin-Madison, 1995.
    • (1995)
    • Edelman, H.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.