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Volumn 39, Issue 16, 2003, Pages 1164-1166
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Charging effect of Si nanocrystals in gate oxide near gate on MOS capacitance
a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
ELECTRIC POTENTIAL;
GATES (TRANSISTOR);
NANOSTRUCTURED MATERIALS;
GATE OXIDE;
MOS DEVICES;
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EID: 0041929304
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:20030772 Document Type: Article |
Times cited : (8)
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References (3)
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