Experiencies and possibilities with a 200 kV monochromated (S)TEM

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 846-847

  Kothleitner, G ^a   Grogger, W ^a   Hofer, F ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041920943     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603444231     Document Type: Conference Paper

References (7)

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2. Brink, H.A., Barfels, M.M.G., Burgner, R.P., and Edwards, B.N. (2003), to be published in Ultramicroscopy
3. Lakner, H., Rafferty, B., and Brockt, G., (1999) J. of Microscopy 194, p79
4. Mitterbauer, C., Kothleitner, G., Grogger, W., Zandbergen, H., Tiemeijer, P., Freitag, B., and Hofer, F., (2003), Ultramicroscopy (accepted for publication)
5. Müller, J. E., and Wilkins, J. W., (1984) Physical Review B 29, p4331
6. Weijs, P. J. W., Czyžyk, M. T., van Acker, J. F., Speier, W., van der Laan, G., Buschow, K. H. J., Wiech, G., and Fuggle, J. C., (1990) Physical Review B 41, p11899
7. Muller, D. A., Singh, D. J. and Silcox, J., (1998) Physical Review B 57, p8181