Preparation of transmission electron microscope specimens from ultra-fine fibers by a FIB technique

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 888-889

  Li, Jian ^a   Gertsman, V Y ^a   Lo, J ^a  

^a CANMET MATERIALS TECHNOLOGY LABORATORY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041920906     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603444449     Document Type: Conference Paper

References (3)

1. L.A. Giannuzzi and F.A. Stevie, Micron, 30, (issue 3) (1999) p.197.
2. J.M. Cairney and P.R. Munroe, Materials Characterization, 46, (2001) p.297.
3. R.J. Patterson et al., Microscopy and Microanalysis (2002) p.566.