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Volumn 32, Issue 4 SUPPL., 1998, Pages

Fabrication and characterization of ferroelectrics/oxide/Si structure

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0041887729     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (6)

References (7)
  • 7
    • 19944384428 scopus 로고
    • Ph. D. thesis KAIST
    • C. J. Kim, Ph. D. thesis (KAIST, 1995).
    • (1995)
    • Kim, C.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.