Electrochemical oxidation of the chalcopyrite surface: An XPS and AFM study in solution at pH 4

Applied Surface Science

Volumn 218, Issue 1-4, 2003, Pages 34-43

  Farquhar, Morag L ^a   Wincott, Paul L ^a   Wogelius, Roy A ^a   Vaughan, David J ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Chalcopyrite; In situ AFM; Surface oxidation; XPS

Indexed keywords

ATOMIC FORCE MICROSCOPY; OXIDATION; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTROCHEMICAL OXIDATION;

COPPER COMPOUNDS;

EID: 0041783160     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00538-5     Document Type: Article

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