A new method for measuring signal integrity in CMOS ICs

Microelectronics International

Volumn 17, Issue 1, 2000, Pages 17-21

  Delmas Bendhia, Sonia ^a   Caignet, Fabrice ^a   Sicard, Etienne ^a  

^a IRISA   (France)

Author keywords

Integrated circuits; Measurement; Sensors

Indexed keywords

EID: 0041781215     PISSN: 13565362     EISSN: None     Source Type: Journal    
DOI: 10.1108/13565360010305886     Document Type: Article

References (6)

1. Delmas, S. (1999), "Les systèmes de mesure pour circuits intégrés directement sur silicium", Revue de l'Électricité et de l'Électronique (REE), No. 3, pp. 18-19.
2. Delmas-Bendhia, S. (1998), "Une nouvelle méthodologie de caractérisation de l'intégrité du signal en CMOS submicronique profond", PhD Thesis, Institut National des Sciences Appliquées de Toulouse.
3. Delmas-Bendhia, S. (1999), "On-chip sampling in CMOS integrated circuits", IEEE Trans. on Electromagnetic Compatibility, Vol. 41 No. 4.
4. Delorme, N. (1996), "Inductance and capacitance analytic formulas for VLSI interconnects", Electronic Letters, Vol. 32 No. 11, pp. 996-97.
5. Fourniols, J.Y. (1998), "Characterization of cross-talk noise in submicron CMOS integrated circuits: an experimental view", IEEE Trans. on Electromagnetic Compatibility, Vol. 40 No. 3, pp. 271-80.
6. Grabinski, H. (1998), Signal Propagation on Interconnects, Kluwer Academic Publishers, London.