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Volumn 15, Issue 15, 2003, Pages 3035-3040

Thermoelectric properties and site-selective Rb+/K+ distribution in the K2-xRbxBi8Se13 series

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CRYSTALLOGRAPHY; ELECTRONIC PROPERTIES; HALL EFFECT; LATTICE CONSTANTS; SOLID SOLUTIONS; THERMOELECTRICITY;

EID: 0041766228     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm034185v     Document Type: Article
Times cited : (21)

References (24)
  • 5
    • 0041483625 scopus 로고    scopus 로고
    • note
    • 2σ is called the power factor.
  • 15
    • 0042485482 scopus 로고    scopus 로고
    • Ph.D. Thesis, Northwestern University; Dissertation Abstracts No. 9974255
    • Brazis, P. W. Ph.D. Thesis, Northwestern University 2000; Dissertation Abstracts No. 9974255.
    • (2000)
    • Brazis, P.W.1
  • 16
    • 0042986297 scopus 로고
    • Molecular Simulations Inc.: Cambridge
    • 2, Version 2.35; Molecular Simulations Inc.: Cambridge, U.K., 1995.
    • (1995) 2, Version 2.35
  • 17
    • 0042485479 scopus 로고
    • Siemens Analytical Xray Systems, Inc.: Madison, WI
    • SMART: 1994; Siemens Analytical Xray Systems, Inc.: Madison, WI, 1994.
    • (1994) SMART: 1994
  • 18
    • 0041483615 scopus 로고
    • Siemens Analytical Xray Systems, Inc.: Madison, WI
    • SAINT: Version 4, 1994-1996; Siemens Analytical Xray Systems, Inc.: Madison, WI, 1994-1996.
    • (1994) SAINT: Version 4, 1994-1996
  • 19
    • 0041483619 scopus 로고    scopus 로고
    • University of Göttingen, Göttingen, Germany, to be published
    • Sheldrick, G. M. University of Göttingen, Göttingen, Germany, to be published.
    • Sheldrick, G.M.1
  • 20
    • 0004150157 scopus 로고
    • Siemens Analytical Xray Systems, Inc.: Madison, WI
    • Sheldrick, G. M. SHELXTL: Version 5, 1994; Siemens Analytical Xray Systems, Inc.: Madison, WI, 1994.
    • (1994) SHELXTL: Version 5, 1994
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.