Optical engineering and characterization of the internal electric field of CdZnTe radiation detectors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3768, Issue , 1999, Pages 330-338

  Yao, H Walter ^a   James, Ralph B ^a   Erickson, Jay C ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; ELECTRIC FIELDS; ELECTROOPTICAL DEVICES; INFRARED RADIATION; LIGHT POLARIZATION; LIGHT TRANSMISSION; OPTICAL DESIGN; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTOR COUNTERS; SEMICONDUCTOR DEVICE MODELS;

CADMIUM ZINC TELLURIDE; OPTICAL ENGINEERING; POCKELS ELECTROOPTIC EFFECT;

PARTICLE DETECTORS;

EID: 0033318024     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.366598     Document Type: Conference Paper

References (7)