Track etch rates along the trajectories of nitrogen and oxygen ions in CR-39

Radiation Measurements

Volumn 37, Issue 6, 2003, Pages 583-587

  Dorschel B ^a   Hermsdorf, D ^a   Starke, S ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

14N ions; 16O ions; CR 39; Restricted energy loss; Track etch rate

Indexed keywords

COMPUTER PROGRAMMING; ENERGY DISSIPATION; ETCHING; ION SOURCES; PARTICLE BEAM TRACKING;

TRACK ETCH RATES;

PARTICLE DETECTORS;

EID: 0041761728     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(03)00046-5     Document Type: Article

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