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Volumn 35, Issue 3, 2002, Pages 177-182

Variation of the track etch rate along the trajectories of light ions in CR-39

Author keywords

CR 39; Ion range; Light ions; Restricted energy loss; Track etch rate; Track length

Indexed keywords

ALPHA PARTICLES; CORRELATION METHODS; ETCHING; PARTICLE DETECTORS; TRAJECTORIES;

EID: 0036012692     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(02)00047-1     Document Type: Article
Times cited : (26)

References (12)
  • 12
    • 0034248224 scopus 로고    scopus 로고
    • Three dimensional analytical determination of the track parameters
    • (2001) Radiat. Meas. , vol.32 , pp. 277-282
    • Nikezic, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.