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Volumn 35, Issue 3, 2002, Pages 177-182
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Variation of the track etch rate along the trajectories of light ions in CR-39
a a a a |
Author keywords
CR 39; Ion range; Light ions; Restricted energy loss; Track etch rate; Track length
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Indexed keywords
ALPHA PARTICLES;
CORRELATION METHODS;
ETCHING;
PARTICLE DETECTORS;
TRAJECTORIES;
TRACK ETCH RATE;
ENERGY DISSIPATION;
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EID: 0036012692
PISSN: 13504487
EISSN: None
Source Type: Journal
DOI: 10.1016/S1350-4487(02)00047-1 Document Type: Article |
Times cited : (26)
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References (12)
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