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Volumn 37, Issue 6, 2003, Pages 573-582

Computation of etched track profiles in CR-39 and comparison with experimental results for light ions of different kinds and energies

Author keywords

Computation model; CR 39; Light ions; Track etch rate; Track profile

Indexed keywords

ALGORITHMS; ALPHA PARTICLES; COMPUTER SIMULATION; DOSIMETRY; ETCHING; IONS; OPTICAL MICROSCOPY; PARTICLE BEAM TRACKING; PROTONS;

EID: 0043264841     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(03)00047-7     Document Type: Article
Times cited : (29)

References (16)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.