-
1
-
-
0022078666
-
The discovery of the quantum Hall effect
-
Landwehr G 1986 The discovery of the quantum Hall effect Metrologia 22 118-27
-
(1986)
Metrologia
, vol.22
, pp. 118-127
-
-
Landwehr, G.1
-
3
-
-
0007484909
-
Quantum galvanometric effect in n-channel silicon inversion layers under strong magnetic fields
-
Kawaji S, Igarashi T and Wakabayashi J 1975 Quantum galvanometric effect in n-channel silicon inversion layers under strong magnetic fields Prog. Theor. Phys. Suppl. 57 176-86
-
(1975)
Prog. Theor. Phys.
, vol.57
, Issue.SUPPL.
, pp. 176-186
-
-
Kawaji, S.1
Igarashi, T.2
Wakabayashi, J.3
-
4
-
-
0002493636
-
xx minima in surface quantum oscillation on (100) n-type silicon inversion layers
-
xx minima in surface quantum oscillation on (100) n-type silicon inversion layers Surf. Sci. 73 70-80
-
(1978)
Surf. Sci.
, vol.73
, pp. 70-80
-
-
Englert, T.1
von Klitzing, K.2
-
5
-
-
33745141474
-
New method for high-accuracy determination of the fine structure constant based on quantized Hall resistance
-
von Klitzing K, Dorda G and Pepper M 1980 New method for high-accuracy determination of the fine structure constant based on quantized Hall resistance Phys. Rev. Lett. 45 494-7
-
(1980)
Phys. Rev. Lett.
, vol.45
, pp. 494-497
-
-
von Klitzing, K.1
Dorda, G.2
Pepper, M.3
-
6
-
-
35949021210
-
The quantized Hall effect
-
von Klitzing K 1986 The quantized Hall effect Rev. Mod. Phys. 58 519-31
-
(1986)
Rev. Mod. Phys.
, vol.58
, pp. 519-531
-
-
von Klitzing, K.1
-
7
-
-
0035667018
-
The quantum Hall effect as an electrical resistance standard
-
Jeckelmann B and Jeanneret B 2001 The quantum Hall effect as an electrical resistance standard Rep. Prog. Phys. 64 1603-55
-
(2001)
Rep. Prog. Phys.
, vol.64
, pp. 1603-1655
-
-
Jeckelmann, B.1
Jeanneret, B.2
-
8
-
-
0003414482
-
Experimental aspects and metrological applications
-
2nd edn (New York: Springer)
-
Cage M 1990 Experimental aspects and metrological applications The Quantum Hall Effect 2nd edn (New York: Springer) pp 37-67
-
(1990)
The Quantum Hall Effect
, pp. 37-67
-
-
Cage, M.1
-
9
-
-
0026861396
-
The quantum Hall effect and resistance standards
-
Hartland A 1992 The quantum Hall effect and resistance standards Metrologia 29 175-90
-
(1992)
Metrologia
, vol.29
, pp. 175-190
-
-
Hartland, A.1
-
10
-
-
0001440281
-
Electrical resistance standards and the quantum Hall effect
-
Witt T J 1998 Electrical resistance standards and the quantum Hall effect Rev. Sci. Instrum. 69 2823-43
-
(1998)
Rev. Sci. Instrum.
, vol.69
, pp. 2823-2843
-
-
Witt, T.J.1
-
15
-
-
85032069152
-
Electronic properties of two-dimensional systems
-
Ando T, Fowler A B and Stern F 1982 Electronic properties of two-dimensional systems Rev. Mod. Phys. 54 437-672
-
(1982)
Rev. Mod. Phys.
, vol.54
, pp. 437-672
-
-
Ando, T.1
Fowler, A.B.2
Stern, F.3
-
16
-
-
0001548156
-
Quantized Hall effect
-
Aoki H 1987 Quantized Hall effect Rep. Prog. Phys. 50 655-730
-
(1987)
Rep. Prog. Phys.
, vol.50
, pp. 655-730
-
-
Aoki, H.1
-
17
-
-
0001765388
-
Integral quantum Hall effect for nonspecialists
-
Yennie D R 1987 Integral quantum Hall effect for nonspecialists Rev. Mod. Phys. 59 781-824
-
(1987)
Rev. Mod. Phys.
, vol.59
, pp. 781-824
-
-
Yennie, D.R.1
-
18
-
-
0028259858
-
Quantum transport in semiconductors surface and interface channels
-
Kawaji S 1994 Quantum transport in semiconductors surface and interface channels Surf. Sci. 299/300 563-86
-
(1994)
Surf. Sci.
, vol.299
, Issue.300
, pp. 563-586
-
-
Kawaji, S.1
-
19
-
-
11944263212
-
Scaling theory of the integer quantum Hall effect
-
Huckestein B 1995 Scaling theory of the integer quantum Hall effect Rev. Mod. Phys. 67 357-96
-
(1995)
Rev. Mod. Phys.
, vol.67
, pp. 357-396
-
-
Huckestein, B.1
-
20
-
-
84996237073
-
Electrical resistance of disordered one-dimensional lattices
-
Landauer R 1970 Electrical resistance of disordered one-dimensional lattices Phil. Mag. 21 863-67
-
(1970)
Phil. Mag.
, vol.21
, pp. 863-867
-
-
Landauer, R.1
-
21
-
-
24244440841
-
Absence of backscattering in the quantum Hall effect in multiprobe conductors
-
Büttiker M 1988 Absence of backscattering in the quantum Hall effect in multiprobe conductors Phys. Rev. B 38 9375-89
-
(1988)
Phys. Rev. B
, vol.38
, pp. 9375-9389
-
-
Büttiker, M.1
-
22
-
-
0027540160
-
Edge state transport and its experimental consequences in high magnetic fields
-
Haug R J 1993 Edge state transport and its experimental consequences in high magnetic fields Semicond. Sci. Technol. 8 131-53
-
(1993)
Semicond. Sci. Technol.
, vol.8
, pp. 131-153
-
-
Haug, R.J.1
-
24
-
-
0007531515
-
Measurement system for quantum Hall effect utilizing a Josephson potentiometer
-
Endo T, Murayama Y, Koyanagi M, Kinoshita J, Inagaki K, Yamanouchi C and Yoshihiro K 1985 Measurement system for quantum Hall effect utilizing a Josephson potentiometer IEEE Trans. Instrum. Meas. 34 323-7
-
(1985)
IEEE Trans. Instrum. Meas.
, vol.34
, pp. 323-327
-
-
Endo, T.1
Murayama, Y.2
Koyanagi, M.3
Kinoshita, J.4
Inagaki, K.5
Yamanouchi, C.6
Yoshihiro, K.7
-
25
-
-
0022732696
-
High-precision resistance ratio measurements by means of a novel Josephson potentiometer
-
Warnecke P, Niemeyer J, Dünschede F W, Grimm L, Weimann G and Schlapp W 1987 High-precision resistance ratio measurements by means of a novel Josephson potentiometer IEEE Trans. Instrum. Meas. 36 249-51
-
(1987)
IEEE Trans. Instrum. Meas.
, vol.36
, pp. 249-251
-
-
Warnecke, P.1
Niemeyer, J.2
Dünschede, F.W.3
Grimm, L.4
Weimann, G.5
Schlapp, W.6
-
27
-
-
0003259253
-
A direct-current comparator ratio bridge for four-terminal resistance measurements
-
MacMartin M P and Kusters N L 1966 A direct-current comparator ratio bridge for four-terminal resistance measurements IEEE Trans. Instrum. Meas. 15 212-20
-
(1966)
IEEE Trans. Instrum. Meas.
, vol.15
, pp. 212-220
-
-
MacMartin, M.P.1
Kusters, N.L.2
-
28
-
-
0015433249
-
Precise low temperature de ratio transformer
-
Harvey I K 1972 Precise low temperature de ratio transformer Rev. Sci. Instrum. 43 1626-9
-
(1972)
Rev. Sci. Instrum.
, vol.43
, pp. 1626-1629
-
-
Harvey, I.K.1
-
29
-
-
0016050051
-
Low temperature direct current comparators
-
Sullivan D B and Dziuba R F 1974 Low temperature direct current comparators Rev. Sci. Instrum. 45 517-19
-
(1974)
Rev. Sci. Instrum.
, vol.45
, pp. 517-519
-
-
Sullivan, D.B.1
Dziuba, R.F.2
-
30
-
-
0026142690
-
An automated cryogenic current comparator resistance ratio bridge
-
Williams J M and Hartland A 1991 An automated cryogenic current comparator resistance ratio bridge IEEE Trans. Instrum. Meas. 40 267-70
-
(1991)
IEEE Trans. Instrum. Meas.
, vol.40
, pp. 267-270
-
-
Williams, J.M.1
Hartland, A.2
-
31
-
-
0026141912
-
Low-noise measurements of the quantized Hall resistance using an improved cryogenic current comparator bridge
-
Delahaye F and Bournaud D 1991 Low-noise measurements of the quantized Hall resistance using an improved cryogenic current comparator bridge IEEE Trans. Instrum. Meas. 40 237-40
-
(1991)
IEEE Trans. Instrum. Meas.
, vol.40
, pp. 237-240
-
-
Delahaye, F.1
Bournaud, D.2
-
32
-
-
0027585375
-
Improvements in resistance scaling at NIST using cryogenic current comparators
-
Dziuba R F and Elmquist R E 1993 Improvements in resistance scaling at NIST using cryogenic current comparators IEEE Trans. Instrum. Meas. 42 126-30
-
(1993)
IEEE Trans. Instrum. Meas.
, vol.42
, pp. 126-130
-
-
Dziuba, R.F.1
Elmquist, R.E.2
-
33
-
-
0029290670
-
Improvements in the realisation of the quantized Hall resistance standard at OFMET
-
Jeckelmann B, Fasel W and Jeanneret B 1995 Improvements in the realisation of the quantized Hall resistance standard at OFMET IEEE Trans. Instrum. Meas. 44 265-8
-
(1995)
IEEE Trans. Instrum. Meas.
, vol.44
, pp. 265-268
-
-
Jeckelmann, B.1
Fasel, W.2
Jeanneret, B.3
-
35
-
-
0002437683
-
Direct comparison of the quantized Hall resistance in gallium arsenide and silicon
-
Hartland A, Jones K, Williams J M, Gallagher B L and Galloway T 1991 Direct comparison of the quantized Hall resistance in gallium arsenide and silicon Phys. Rev. Lett. 66 969-73
-
(1991)
Phys. Rev. Lett.
, vol.66
, pp. 969-973
-
-
Hartland, A.1
Jones, K.2
Williams, J.M.3
Gallagher, B.L.4
Galloway, T.5
-
36
-
-
0024646864
-
Quantized Hall resistance measurements
-
Kawaji S, Nagashima N, Kikuchi N, Wakabayashi J, Ricketts B W, Yoshihiro K, Kinoshita J, Inagaki K and Yamanouchi C 1989 Quantized Hall resistance measurements IEEE Trans. Instrum. Meas. 38 270-5
-
(1989)
IEEE Trans. Instrum. Meas.
, vol.38
, pp. 270-275
-
-
Kawaji, S.1
Nagashima, N.2
Kikuchi, N.3
Wakabayashi, J.4
Ricketts, B.W.5
Yoshihiro, K.6
Kinoshita, J.7
Inagaki, K.8
Yamanouchi, C.9
-
37
-
-
0026821888
-
Anomalously offset quantized Hall plateaus in high-mobility Si-MOSFETs
-
van Degrift C T, Yoshihiro K, Cage M E, Yu D, Segawa K, Kinoshita J and Endo T 1992 Anomalously offset quantized Hall plateaus in high-mobility Si-MOSFETs Surf. Sci. 263 116-19
-
(1992)
Surf. Sci.
, vol.263
, pp. 116-119
-
-
van Degrift, C.T.1
Yoshihiro, K.2
Cage, M.E.3
Yu, D.4
Segawa, K.5
Kinoshita, J.6
Endo, T.7
-
38
-
-
0007525190
-
Anomalous behavior of a quantized Hall plateau in a high-mobility Si metal-oxide-semiconductor field-effect transistor
-
Yoshihiro K, van Degrift C T, Cage M E and Yu D 1992 Anomalous behavior of a quantized Hall plateau in a high-mobility Si metal-oxide-semiconductor field-effect transistor Phys. Rev. B 45 14204-14
-
(1992)
Phys. Rev. B
, vol.45
, pp. 14204-14214
-
-
Yoshihiro, K.1
van Degrift, C.T.2
Cage, M.E.3
Yu, D.4
-
39
-
-
0007573925
-
Failure of the integer quantum Hall effect without dissipation
-
Heinonen O and Johnson M D 1994 Failure of the integer quantum Hall effect without dissipation Phys. Rev. B 49 11230-7
-
(1994)
Phys. Rev. B
, vol.49
, pp. 11230-11237
-
-
Heinonen, O.1
Johnson, M.D.2
-
40
-
-
0001125058
-
High precision measurements of the quantized Hall resistance: Experimental conditions for university
-
Jeckelmann B, Jeanneret B and Inglis D 1997 High precision measurements of the quantized Hall resistance: experimental conditions for university Phys. Rev. B 55 13124-34
-
(1997)
Phys. Rev. B
, vol.55
, pp. 13124-13134
-
-
Jeckelmann, B.1
Jeanneret, B.2
Inglis, D.3
-
41
-
-
0001675445
-
Quantized Hall effect and edge currents
-
MacDonald A H and Středa P 1984 Quantized Hall effect and edge currents Phys. Rev. B 29 1616-19
-
(1984)
Phys. Rev. B
, vol.29
, pp. 1616-1619
-
-
MacDonald, A.H.1
Středa, P.2
-
42
-
-
0007568986
-
Finite-size corrections in the quantum Hall effect
-
Shapiro B 1986 Finite-size corrections in the quantum Hall effect J. Phys. C: Solid State Phys. 19 4709-21
-
(1986)
J. Phys. C: Solid State Phys.
, vol.19
, pp. 4709-4721
-
-
Shapiro, B.1
-
43
-
-
0007493315
-
Scattering approach to the von Klitzing effect
-
Brenig W and Wysokinski W 1986 Scattering approach to the von Klitzing effect Z. Phys. B 63 149-54
-
(1986)
Z. Phys. B
, vol.63
, pp. 149-154
-
-
Brenig, W.1
Wysokinski, W.2
-
44
-
-
0007493316
-
An alternative model for the integral quantum Hall effect
-
Johnston R and Schweitzer L 1988 An alternative model for the integral quantum Hall effect Z. Phys. B 72 217-24
-
(1988)
Z. Phys. B
, vol.72
, pp. 217-224
-
-
Johnston, R.1
Schweitzer, L.2
-
45
-
-
0029290089
-
Influence of the device width on the accuracy of quantization in the integer quantum Hall effect
-
Jeanneret B, Jeckelmann B, Bühlmann H J, Houdré R and Ilegens M 1995 Influence of the device width on the accuracy of quantization in the integer quantum Hall effect IEEE Trans. Instrum. Meas. 44 254-7
-
(1995)
IEEE Trans. Instrum. Meas.
, vol.44
, pp. 254-257
-
-
Jeanneret, B.1
Jeckelmann, B.2
Bühlmann, H.J.3
Houdré, R.4
Ilegens, M.5
-
47
-
-
0031117858
-
NIST comparison of the quantized Hall resistance and the realization of the SI ohm through the calculable capacitor
-
Jeffery A M, Elmquist R E, Lee L H, Shields J Q and Dziuba R F 1997 NIST comparison of the quantized Hall resistance and the realization of the SI ohm through the calculable capacitor IEEE Trans. Instrum. Meas. 46 264-8
-
(1997)
IEEE Trans. Instrum. Meas.
, vol.46
, pp. 264-268
-
-
Jeffery, A.M.1
Elmquist, R.E.2
Lee, L.H.3
Shields, J.Q.4
Dziuba, R.F.5
-
48
-
-
0031353683
-
A new determination of the quantized Hall resistance in terms of the NML calculable cross capacitor
-
Small G W, Rickets B W, Coogan P C, Pritchard B J and Sovierzoski M M R 1997 A new determination of the quantized Hall resistance in terms of the NML calculable cross capacitor Metrologia 34 241-3
-
(1997)
Metrologia
, vol.34
, pp. 241-243
-
-
Small, G.W.1
Rickets, B.W.2
Coogan, P.C.3
Pritchard, B.J.4
Sovierzoski, M.M.R.5
-
49
-
-
0022732825
-
The relationship between the SI ohm, the ohm at NPL and the quantized Hall resistance
-
Hartland A, Jones R G, Kibble B P and Legg D J 1987 The relationship between the SI ohm, the ohm at NPL and the quantized Hall resistance IEEE Trans. Instrum. Meas. 36 208-13
-
(1987)
IEEE Trans. Instrum. Meas.
, vol.36
, pp. 208-213
-
-
Hartland, A.1
Jones, R.G.2
Kibble, B.P.3
Legg, D.J.4
-
50
-
-
0034341602
-
CODATA recommended values of the fundamental physical constants
-
Mohr P J and Taylor B N 2000 CODATA recommended values of the fundamental physical constants Rev. Mod. Phys. 72 351-495
-
(2000)
Rev. Mod. Phys.
, vol.72
, pp. 351-495
-
-
Mohr, P.J.1
Taylor, B.N.2
-
51
-
-
0000237002
-
The fine structure constant
-
Kinoshita T 1996 The fine structure constant Rep. Prog. Phys. 59 1459-92
-
(1996)
Rep. Prog. Phys.
, vol.59
, pp. 1459-1492
-
-
Kinoshita, T.1
-
52
-
-
0002205732
-
New international electrical reference standards based on the Josephson and quantum Hall effects
-
Taylor B N and Witt T J 1989 New international electrical reference standards based on the Josephson and quantum Hall effects Metrologia 26 47-62
-
(1989)
Metrologia
, vol.26
, pp. 47-62
-
-
Taylor, B.N.1
Witt, T.J.2
-
53
-
-
12344291517
-
Technical guidelines for reliable measurements of the quantized Hall resistance
-
Delahaye F 1989 Technical guidelines for reliable measurements of the quantized Hall resistance Metrologia 26 63-8
-
(1989)
Metrologia
, vol.26
, pp. 63-68
-
-
Delahaye, F.1
-
54
-
-
0030100806
-
Comparison of quantum Hall effect resistance standards of the OFMET and the BIPM
-
Delahaye F, Witt T J, Jeckelmann B and Jeanneret B 1996 Comparison of quantum Hall effect resistance standards of the OFMET and the BIPM Metrologia 32 385-8
-
(1996)
Metrologia
, vol.32
, pp. 385-388
-
-
Delahaye, F.1
Witt, T.J.2
Jeckelmann, B.3
Jeanneret, B.4
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