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Volumn 21, Issue 4, 2003, Pages 1431-1435
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Epitaxial growth of thin Ag and Au films on Si(111) using thin copper silicide buffer layers
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Author keywords
[No Author keywords available]
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Indexed keywords
BAND STRUCTURE;
BINDING ENERGY;
COPPER COMPOUNDS;
FERMI LEVEL;
GOLD;
LOW ENERGY ELECTRON DIFFRACTION;
PHOTOEMISSION;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SEMICONDUCTING SILICON;
SILVER;
SYNCHROTRON RADIATION;
LATTICE MISMATCH;
SHOCKLEY SURFACE;
THIN COPPER SILICIDE BUFFER LAYERS;
VALENCE BAND SPECTRA;
EPITAXIAL GROWTH;
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EID: 0041733518
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1564035 Document Type: Article |
Times cited : (6)
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References (22)
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