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Physical Review B - Condensed Matter and Materials Physics
Volumn 65, Issue 11, 2002, Pages 1154021-1154028
Modeling photonic force microscopy with metallic particles under plasmon eigenmode excitation
(3)
Arias Gonzalez J R
a
Nieto Vesperinas, M
a
Lester, M
a
a
INSTITUTO DE CIENCIA DE MATERIALES DE MADRID
(
Spain
)
Author keywords
[No Author keywords available]
Indexed keywords
METAL; SILICON;
ANALYTIC METHOD; ARTICLE; ELECTROMAGNETIC FIELD; FORCE; IMAGING SYSTEM; MICROSCOPY; MOTION; NANOPARTICLE; PHOTON; SIGNAL TRANSDUCTION; SURFACE PROPERTY;
EID
:
0041726550
PISSN
:
01631829
EISSN
:
None
Source Type
:
Journal
DOI
:
None
Document Type
:
Article
Times cited : (
23
)
References (
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note
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