Fundamentals and model of photonic-force microscopy

Optics Letters

Volumn 26, Issue 10, 2001, Pages 707-709

  Lester, M ^a,c   Arias Gonzalez J R ^b   Nieto Vesperinas, M ^b  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^c UNIVERSIDAD NACIONAL DEL CENTRO DE LA PROVINCIA DE BUENOS AIRES   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

PHOTONIC-FORCE MICROSCOPY;

DIELECTRIC PROPERTIES; EIGENVALUES AND EIGENFUNCTIONS; INTERFACES (MATERIALS); SURFACE TOPOGRAPHY;

NANOSTRUCTURED MATERIALS;

EID: 0001652388     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.26.000707     Document Type: Article

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