Polarization effects in the scattering of electromagnetic waves by an object beneath a random rough surface

Optics Communications

Volumn 162, Issue 1, 1999, Pages 91-98

  Madrazo, A ^a   Arias Gonzalez J R ^a   Nieto Vesperinas, M ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT SCATTERING; PERTURBATION TECHNIQUES; SURFACE ROUGHNESS;

MUELLER MATRIX ELEMENTS;

LIGHT POLARIZATION;

EID: 0344182445     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(99)00068-1     Document Type: Article

References (20)

1. J.A. Ogilvy, Theory of Wave Scattering from Rough Surfaces, Adam Hilguer, Bristol, 1991.
2. M. Nieto-Vesperinas, J.C. Dainty (Eds.), Scattering in Volumes and Surfaces, North-Holland, Amsterdam, 1990; D. Maystre, J.C. Dainty (Eds.), Waves Random Media (special issue), vol. 3, 1991.
3. M. Nieto-Vesperinas, J.C. Dainty (Eds.), Scattering in Volumes and Surfaces, North-Holland, Amsterdam, 1990; D. Maystre, J.C. Dainty (Eds.), Waves Random Media (special issue), vol. 3, 1991.
4. M. Nieto-Vesperinas, Scattering and Diffraction in Physical Optics, Wiley, New York, 1991, Ch. 7.
5. J.M. Bennett, Surface Finish and its Measurement, OSA, Washington, DC, 1992.
6. Maradudin A., Nieto-Vesperinas M., Thorsos E.I. Comments Cond. Mat. Phys. 17:1994;13. and references therein.
7. Tsang L., Kong J.A., Shin R.T. Microwave Opt. Technol. Lett. 11:1996;300.
8. O'Neill K., Lussky R.F., Paulsen K.D. IEEE Trans. Geosci. Remote Sensing. 34:1996;367.
9. Madrazo A., Nieto-Vesperinas M. J. Opt. Soc. Am. A. 14:1997;1859.
10. Ripoll J., Madrazo A., Nieto-Vesperinas M. Optics Comm. 142:1997;173.
11. O'Donnell K.A., Knotts M.E. J. Opt. Soc. Am. A. 8:1991;1126.
12. Bruce N.C., Sant A.J., Dainty J.C. Optics Comm. 88:1992;471.
13. Michel T.R. J. Opt. Soc. Am. A. 11:1994;1874.
14. U. Hoppe, R. Lunderstadt, G. Sauermann, Noninvasive methods for the quantification of skin functions, in: P.J. Frosch, A.M. Kligman (Eds.), Springer-Verlag, Berlin, 1993, p. 25.
15. S. L Jacques, in: R.R. Alfano, J.G. Fujimoto (Eds.), OSA TOPS on Advances in Optical Imaging and Photon Migration, OSA, Washington, DC, 1996.
16. Cheong W.F., Prahl S.A., Welch A.J. IEEE Quantum Electron. 26:1990;2166.
17. Tsang L., Zhang G., Pak K. Microwave Opt. Technol. Lett. 11:1996;300.
18. J.W. Goodman, Introduction to Fourier Optics, McGraw-Hill, New York, 1968, Ch. 6.
19. Demos S.G., Alfano R.R. Optics Lett. 21:1996;161.
20. Madrazo A., Nieto-Vesperinas M. J. Opt. Soc. Am. A. 12:1995;1298.