Stacking faults in formation of silver nanodisks

Journal of Physical Chemistry B

Volumn 107, Issue 34, 2003, Pages 8717-8720

  Germain, V ^a   Li, Jing ^a   Ingert, D ^a   Wang, Z L ^b   Pileni, M P ^a  

^a SORBONNE UNIVERSITÉ   (France)

^b Georgia Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; GRAIN SIZE AND SHAPE; GROWTH (MATERIALS); HIGH RESOLUTION ELECTRON MICROSCOPY; LIGHT REFLECTION; MATHEMATICAL MODELS; MORPHOLOGY; SILVER; STACKING FAULTS; SUPERLATTICES; TRANSMISSION ELECTRON MICROSCOPY;

DISK SURFACE; FLAT SURFACES; SELECTED AREA ELECTRON DIFFRACTION; SILVER NANODISKS; SUPERLATTICE FRINGES;

NANOSTRUCTURED MATERIALS;

EID: 0041695574     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0303826     Document Type: Letter

References (18)

1. Pileni, M. P. Nature Mater. 2003, 2, 145-150.
2. Wang, Z. L. J. Phys. Chem. 2000, 104, 1153.
3. Kirkland, A. I.; Jefferson, D. A.; Duff, D. G.; Edwards, P. P.; Gameson, I.; Johnson, B. F. G.; Smith, D. J. Proc. R. Soc. London A 1993, 440, 589-609.
4. Jin, R.; Cao, Y. W.; Mirkin, C. A.; Kelly, K. L.; Schatz, G. C.; Zheng, J. G. Science 2001, 294, 1901.
5. Maillard, M.; Giorgio, S.; Pileni, M. P. Adv. Mater. 2002, 14, 15, 1084.
6. Chen, S.; Fan, Z.; Carroll, D. L. J. Phys. Chem. 2002, 106, 10777.
7. Pastoriza-Santos, I.; Liz-Marzan, M. L. Nano Lett. 2002, 2, 903.
8. Maillard, M.; Giorgio, S.; Pileni, M. P. J. Phys. Chem. 2003, 107, 11, 1466-2470.
9. Cherns, D. Philos. Mag. 1974, 30, 549.
10. Kirkland, A. I.; Jefferson, D. A.; Duff, D. G.; Edwards, P. P. Inst. Phys. Conf. Ser. 1989, 98, 375.
11. Tanaka, N.; Cowley, J. M. Mater. Res. Soc. Symp. Proc. 1985, 41, 155
12. Heyraud, J. C.; Métois, J. J. Surf. Sci. 1980, 100, 519.
13. TEM images at moderate resolution and SAED patterns were recorded using a Hitachi HF-2000 field emission gun (FEG) transmission electron microscope (TEM) operating at 200 kV; and HRTEM was carried out using a JEOL 4000EX microscope operating at 400 kV.
14. Dahmen, U.; Hethering, C. J. D.; Radmilovic, V.; Johnson, E. E. J.; Xiao, S. Q.; Luo, C. P. Proc. 15th Int. Congr. Electron. Microsc. 2002, 131.
15. Petit, C.; Lixon, P.; Pileni, M. P. J. Phys. Chem. 1993, 97, 12974.
16. Sodium di(2-ethyl-hexyl)sulfoccinate Na(AOT), isooctane, hydrazine and dodecanethiol were from Sigma, Fluka, Prolabo (France) and Janssen Chemicals, respectively. The products were used without further purification.
17. Carim, A. H.; Lew, K. K.; Redwing, J. M. Adv. Mater. 2001, 1489.
18. Hirsch, P.; Howie, A.; Nicholson, R. B.; Pashley, D. W.; Whelan, M. J. Electron Microscopy of Thin Crystals, Robert E. Krieger Publishing Company: New York, 1977.