On the design and characterization of femtoampere current-mode circuits

IEEE Journal of Solid-State Circuits

Volumn 38, Issue 8, 2003, Pages 1353-1363

  Linares Barranco, Bernabé ^a   Serrano Gotarredona, Teresa ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE SEVILLA   (Spain)

Author keywords

Analog VLSI design; Leakage currents; Mismatch; Noise; Subthreshold; Ultralow currents; Weak inversion

Indexed keywords

ELECTRIC CURRENTS; LEAKAGE CURRENTS; OSCILLATORS (ELECTRONIC); SIGNAL PROCESSING; TRANSISTORS; VLSI CIRCUITS;

CURRENT-MODE CIRCUITS;

CMOS INTEGRATED CIRCUITS;

EID: 0041695254     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2003.814415     Document Type: Article

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