A low-power low-noise ultrawide-dynamic-range CMOS imager with pixel-parallel A/D conversion

IEEE Journal of Solid-State Circuits

Volumn 36, Issue 5, 2001, Pages 846-853

  McIlrath, Lisa G ^a,b  

^a IEEE   (United States)

^b 3D IC Inc   (United States)

Author keywords

Analog digital conversion; Image sensors; Sigma delta modulation; Smart pixels

Indexed keywords

CMOS IMAGE SENSOR; FREE-RUNNING PHOTOCURRENT-CONTROLLED OSCILLATOR; PIXEL CIRCUIT DESIGN; PIXEL-PARALLEL ANALOG-TO-DIGITAL CONVERSION; REVERSE-BIASED DIODE;

ANALOG TO DIGITAL CONVERSION; CAPACITANCE; DELTA SIGMA MODULATION; ELECTRIC LOSSES; IMAGE QUALITY; IMAGE SENSORS; INTEGRATED CIRCUIT LAYOUT; OSCILLATORS (ELECTRONIC); PHOTOCURRENTS; PHOTODIODES; SPURIOUS SIGNAL NOISE;

CMOS INTEGRATED CIRCUITS;

EID: 0035334375     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.918924     Document Type: Article

References (12)

1. CMOS image sensors: Electronic camera-on-a-chip
2. A Nyquist-rate pixel-level ADC for CMOS image sensors
3. CMOS area image sensors with pixel level A/D conversion
4. A 128×128 pixel CMOS area image sensor with multiplexed pixel level A/D conversion
5. A 256×256 CMOS imaging array with wide dynamic range pixels and column-parallel digital output
6. Design and fabrication of a high dynamic range image sensor in TFA technology
7. A 640×512 CMOS image sensor with ultrawide dynamic range floating-point pixel-level ADC
8. MAPP2200: A second-generation smart optical sensor
9. A VLSI sorting image sensor: Globally massively parallel intensity-to-time processing for low latency adaptive vision
10. A wide-dynamic range, low-power photosensor array
11. The structure of quantization noise from sigma-delta modulation
12. A robust exact method for optimal decoding of first-order ∑-Δ sequences