Atomic force microscopy study of the structure of short-wavelength laser static recording bits in TeOx thin film

Guangxue Xuebao/Acta Optica Sinica

Volumn 21, Issue 10, 2001, Pages 1177-1181

  Li, Qinghui ^a   Sun, Jielin ^a   Wang, Haifeng ^a   Gan, Fuxi ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Atomic force microscopy; Optical storage; Static recording; TeOx thin film

Indexed keywords

ATOMIC FORCE MICROSCOPY; LASER PULSES; SIGNAL TO NOISE RATIO; TELLURIUM COMPOUNDS;

OPTICAL STORAGE; STATIC RECORDING;

THIN FILMS;

EID: 0035494503     PISSN: 02532239     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)

1. Sub-oxside thin films for an optical recording disk
2. x films
3. New optical erasable medium using tellurium suboxside thin film
4. Dual-layer optical disk with Te-O-Pd phase-change film
5. Near-field data storage
6. A new super-resolution film applicable to read-only and rewritable optical disks
7. x thin films for optical recording