Interface effects and the Auger parameter in titanium oxide thin films deposited on metals and in sandwich structures

Journal of Electron Spectroscopy and Related Phenomena

Volumn 87, Issue 1, 1997, Pages 61-71

  Lassaletta, G ^a   Fernandez A ^a   Gonzalez Elipe A R ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA   (Spain)

Author keywords

Auger parameter; Thin films; TiO2; TiO2 metal interface; XPS

Indexed keywords

EID: 0041632071     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00072-8     Document Type: Article

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