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Volumn 94, Issue 4, 2003, Pages 2331-2336
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Continuous index of refraction measurements to 20 GPa in Z-cut sapphire
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Author keywords
[No Author keywords available]
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Indexed keywords
COPPER;
INTERFACES (MATERIALS);
INTERFEROMETERS;
INTERFEROMETRY;
MAGNETIC FIELD EFFECTS;
PARTICLE ACCELERATORS;
SAPPHIRE;
SINGLE CRYSTALS;
SURFACES;
REFRACTION MEASUREMENTS;
REFRACTIVE INDEX;
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EID: 0041422235
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1595710 Document Type: Article |
Times cited : (43)
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References (19)
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